cMOF Evidence Base
Spectroscopy — Oriented Growth of In-Oxo Chain Based Metal-Porphyrin Framework Thin Film for High-Sensitive Photodetector

Measurement evidence

Spectroscopy

Oriented Growth of In-Oxo Chain Based Metal-Porphyrin Framework Thin Film for High-Sensitive Photodetector · Tian Y.-B., Vankova N., Weidler P. et al. · Advanced Science · 2021 · 2100548

2 measurement groups · 7 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

UV-vis absorption spectroscopy and Tauc plot

UV-visible and optical absorption spectroscopy

In-TCPP SURMOF, 15 LPE cycles · Thin Film

Spectra from 300 to 800 nm; visible absorption and Q bands assessed.

Geometry
thin film
Context
pristine oriented SURMOF
Measurement source
3-4 · Results and Discussion · Figure 1c
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
Tauc plot optical gapMarked as a best value within this paperEg = 1.78 eV from Figure 1c inset——Figure Axis
Rounded Reported		3 · Results and Discussion · Figure 1c inset
strong absorption bandaround 420 nm——Text
Approximate		4 · Results and Discussion · Figure 1c

X-ray photoelectron spectroscopy

X-ray photoelectron spectroscopy

In-TCPP SURMOF, 15 LPE cycles · Thin Film

N 1s and In 3d regions used to assess porphyrin protonation/free-base units and indium valence.

Geometry
thin film
Context
pristine oriented SURMOF
Measurement source
4 · Results and Discussion · Figure 1d; Figure S5
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
indium valence assignment+3——Text
Qualitative		4 · Results and Discussion · Figure S5
=N- N 1s XPS peak397.7 eV——Text
Exact Reported		4 · Results and Discussion · Figure 1d
In 3d3/2 XPS peak452.8 eV——Text
Exact Reported		4 · Results and Discussion · Figure S5
In 3d5/2 XPS peak445.3 eV——Text
Exact Reported		4 · Results and Discussion · Figure S5
N-H N 1s XPS peak399.8 eV——Text
Exact Reported		4 · Results and Discussion · Figure 1d