Other — Oriented Growth of In-Oxo Chain Based Metal-Porphyrin Framework Thin Film for High-Sensitive Photodetector

Measurement evidence

Other

Oriented Growth of In-Oxo Chain Based Metal-Porphyrin Framework Thin Film for High-Sensitive Photodetector · Tian Y.-B., Vankova N., Weidler P. et al. · Advanced Science · 2021 · 2100548

2 measurement groups · 3 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

Contact angle measurement

Contact angle and wettability

In-TCPP SURMOF, 15 LPE cycles · Thin Film

Contact angle of bare SiO2/Si substrate and In-TCPP SURMOF.

Geometry: thin film on SiO2/Si
Context: pristine oriented SURMOF
Measurement source: 14 · Results and Discussion · Figure S8

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
In-TCPP SURMOF contact angle	89 deg	—	—	Figure Axis Rounded Reported	14 · Results and Discussion · Figure S8b

QCM-D in-situ growth monitoring

In-TCPP SURMOF on MUD-functionalised Au QCM-D chip · Thin Film

In(NO3)3 and TCPP alternately pumped through QCM-D cell with ethanol washing; QCM-D cell at 50 deg C, flow 100 ul/min in SI.

Temperature: 323
Atmosphere: liquid phase
Geometry: Au-coated QCM chip, 10 mm working electrode diameter
Context: pristine oriented SURMOF growth
Measurement source: 3 · Results and Discussion · Figure 1b; Figure S2

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
QCM-D flow rate	100 ul/min	—	—	Text Exact Reported	6 · in-situ monitoring the growth process of In-TCPP SURMOF · Figure S2
QCM-D In(NO3)3 step plateau time	approximately 15 min	—	—	Text Approximate	3 · Results and Discussion · Figure 1b