SEM and AFM
In-TCPP SURMOF, 15 LPE cycles · Thin Film
Surface SEM, cross-sectional SEM and AFM roughness analysis for oriented films; thickness varied by LPE cycles.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| 15-cycle AFM roughnessMarked as a best value within this paper | ~ +/-5 nm | — | reported as ~ +/-5 nm | SI Table Approximate | 25 · Results and Discussion · Table S4 |
| 20-cycle AFM roughness | ~ +/-15 nm | — | reported as ~ +/-15 nm | SI Table Approximate | 25 · Results and Discussion · Table S4 |
| 10-cycle film thickness | approximately 130 nm | — | — | Text Approximate | 4 · Results and Discussion · Figure 2; Figure S7 |
| 15-cycle film thicknessMarked as a best value within this paper | approximately 170 nm | — | — | Text Approximate | 5 · Results and Discussion · Figure 2 |
| 20-cycle film thickness | approximately 240 nm | — | — | Text Approximate | 4 · Results and Discussion · Figure 2; Figure S7 |
| 5-cycle film thickness | approximately 60 nm | — | — | Text Approximate | 4 · Results and Discussion · Figure 2; Figure S7 |