Diffraction Structure — Does the Mode of Metal-Organic Framework/Electrode Adhesion Determine Rates for Redox-Hopping-Based Charge Transport within Thin-Film Metal-Organic Frameworks?

Measurement evidence

Diffraction Structure

Does the Mode of Metal-Organic Framework/Electrode Adhesion Determine Rates for Redox-Hopping-Based Charge Transport within Thin-Film Metal-Organic Frameworks? · Duan J., Goswami S., Patwardhan S. et al. · Journal of Physical Chemistry C · 2022 · 4601-4611

2 measurement groups · 3 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

PXRD in reflection mode, CuKalpha1 radiation

X-ray diffraction and scattering

EPD-MOF-525 · Thin Film

Compared with simulated MOF-525 and powder patterns; low-angle check for PCN-222 in SI

Context: pristine MOF thin film
Measurement source: 3 · Instrumentation; Film Characterization · Figure 2; Figure S1

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
relative PXRD intensity/orientation interpretation	EPD-MOF-525 more random orientations than ST-MOF-525	—	—	Text Qualitative	3 · Film Characterization · Figure 2
PXRD phase assignment	matches simulated MOF-525; low-angle PCN-222 peak absent	—	—	Text Qualitative	3 · Film Characterization · Figure 2; Figure S1

PXRD in reflection mode, CuKalpha1 radiation

X-ray diffraction and scattering

ST-MOF-525 · Thin Film

Compared with simulated MOF-525 and powder patterns; film collected with/without spinning

Context: pristine MOF thin film
Measurement source: 3 · Instrumentation; Film Characterization · Figure 2

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
PXRD phase assignment	matches simulated MOF-525; low-angle PCN-222 peak absent	—	—	Text Qualitative	3 · Film Characterization · Figure 2; Figure S1