Measurement evidence
Does the Mode of Metal-Organic Framework/Electrode Adhesion Determine Rates for Redox-Hopping-Based Charge Transport within Thin-Film Metal-Organic Frameworks? · Duan J., Goswami S., Patwardhan S. et al. · Journal of Physical Chemistry C · 2022 · 4601-4611
Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.
bulk MOF-525 powder following ref 71 · Powder
Bulk MOF-525 powder composition comparison
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| inferred average node connectivity | 8 | — | — | Text Exact Reported | 4 · Film Characterization |
| N/Zr ratio | 2.7:1 | — | — | Text Exact Reported | 4 · Film Characterization |
EPD-MOF-525 · Thin Film
N/Zr ratios used to infer linker/node ratio and missing-node defects
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| inferred linker/node ratio | 4.1:1 | — | — | Text Exact Reported | 4 · Film Characterization |
| N/Zr ratio | 6.2:1 | — | — | Text Exact Reported | 4 · Film Characterization |
ST-MOF-525 · Thin Film
N/Zr ratios used to infer linker/node ratio and missing-node defects
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| inferred linker/node ratio | 3.6:1 | — | — | Text Exact Reported | 4 · Film Characterization |
| N/Zr ratio | 5.4:1 | — | — | Text Exact Reported | 4 · Film Characterization |