Microscopy Morphology — Does the Mode of Metal-Organic Framework/Electrode Adhesion Determine Rates for Redox-Hopping-Based Charge Transport within Thin-Film Metal-Organic Frameworks?

Measurement evidence

Microscopy Morphology

Does the Mode of Metal-Organic Framework/Electrode Adhesion Determine Rates for Redox-Hopping-Based Charge Transport within Thin-Film Metal-Organic Frameworks? · Duan J., Goswami S., Patwardhan S. et al. · Journal of Physical Chemistry C · 2022 · 4601-4611

2 measurement groups · 3 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

SEM

Scanning electron microscopy

EPD-MOF-525 · Thin Film

Cross-sectional and top-view SEM; samples coated with 9 nm OsO4

Context: pristine MOF thin film
Measurement source: 4 · Results and Discussion · Figure 3; Table 1

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
packing/contact-area observation	complete areal coverage but less dense packing and smaller MOF/electrode contact area than ST-MOF-525	—	—	Text Qualitative	6 · Residual Differences · Figure 3
film thicknessMarked as a best value within this paper	6.5 +/- 0.4 um	—	+/- 0.4 um	Table Exact Reported	4 · Film Characterization · Table 1; Figure 3

SEM

Scanning electron microscopy

ST-MOF-525 · Thin Film

Cross-sectional and top-view SEM; samples coated with 9 nm OsO4

Context: pristine MOF thin film
Measurement source: 4 · Results and Discussion · Figure 3; Table 1

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
film thicknessMarked as a best value within this paper	3.4 +/- 0.2 um	—	+/- 0.2 um	Table Exact Reported	4 · Film Characterization · Table 1; Figure 3