SEM and TEM
CNT/GOx@ZIF-8 nanomesh · Powder
SEM images obtained at 10 kV; TEM images obtained at 200 kV.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| CNT/GOx@ZIF-8 morphology | interlaced nanomesh; rough interfaces and reticulated distribution; GOx-encapsulated ZIF-8 growing along CNTs | — | — | Text Qualitative | p003 · 2.2. Characterization of CNT/GOx@ZIF-8 · Figure 2a,b |