Electrical Transport — Growth mechanisms and anisotropic softness-dependent conductivity of orientation-controllable metal-organic framework nanofilms

Measurement evidence

Electrical Transport

Growth mechanisms and anisotropic softness-dependent conductivity of orientation-controllable metal-organic framework nanofilms · Yao M.-S., Otake K.-I., Koganezawa T. et al. · Proceedings of the National Academy of Sciences of the United States of America · 2023 · e2305125120

17 measurement groups · 22 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

time-dependent conductivity decrease during dry/RH air cycling

Electrical conductivity

Cu0.1 P2.0-20C · Thin Film

Measurement source: p049

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
conductivity decrease at RH 30%	about 230 %	—	—	Visual Estimate Approximate	p049
conductivity decrease at RH 70%	about 460 %	—	—	Visual Estimate Approximate	p049

time-dependent conductivity decrease during dry/RH air cycling

Electrical conductivity

Cu0.1 P0.1-30C · Thin Film

Measurement source: p048

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
conductivity decrease at RH 70%	about 530 %	—	—	Visual Estimate Approximate	p048

time-dependent conductivity decrease during dry/RH air cycling

Electrical conductivity

Cu1.0 P0.1-20C · Thin Film

Measurement source: p047

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
conductivity decrease at RH 10%	about 100 %	—	—	Visual Estimate Approximate	p047
conductivity decrease at RH 30%	about 350 %	—	—	Visual Estimate Approximate	p047
conductivity decrease at RH 50%	about 600 %	—	—	Visual Estimate Approximate	p047
conductivity decrease at RH 70%	about 850 %	—	—	Visual Estimate Approximate	p047
conductivity decrease at RH 90%	about 1500 %	—	—	Visual Estimate Approximate	p047

linear I-V conductivity

Electrical conductivity

Cu0.1 P1.0-10C · Thin Film

Electronic conductivity parallel to substrate from Os patterned electrodes in air at room temperature.

Atmosphere: air
Geometry: parallel Os electrodes; 0.5 mm gap; 3.0 mm electrode length
Context: pristine Cu-HHTP unless noted
Measurement source: SI p013 · Table S1; Evaluation of electrical performances · Table S1; Fig. S21-S24

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
electrical conductivity	0.01392 S cm-1	—	—	SI Table Exact Reported	SI p013 · Table S1 · Table S1

linear I-V conductivity

Electrical conductivity

Cu0.1 P1.0-20C · Thin Film

Electronic conductivity parallel to substrate from Os patterned electrodes in air at room temperature.

Atmosphere: air
Geometry: parallel Os electrodes; 0.5 mm gap; 3.0 mm electrode length
Context: pristine Cu-HHTP unless noted
Measurement source: SI p013 · Table S1; Evaluation of electrical performances · Table S1; Fig. S21-S24

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
electrical conductivity	0.1042 S cm-1	—	—	SI Table Exact Reported	SI p013 · Table S1 · Table S1

linear I-V conductivity

Electrical conductivity

Cu0.1 P1.0-5C · Thin Film

Electronic conductivity parallel to substrate from Os patterned electrodes in air at room temperature.

Atmosphere: air
Geometry: parallel Os electrodes; 0.5 mm gap; 3.0 mm electrode length
Context: pristine Cu-HHTP unless noted
Measurement source: SI p013 · Table S1; Evaluation of electrical performances · Table S1; Fig. S21-S24

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
electrical conductivity	0.00102 S cm-1	—	—	SI Table Exact Reported	SI p013 · Table S1 · Table S1

linear I-V conductivity

Electrical conductivity

Cu0.1 P2.0-10C · Thin Film

Electronic conductivity parallel to substrate from Os patterned electrodes in air at room temperature.

Atmosphere: air
Geometry: parallel Os electrodes; 0.5 mm gap; 3.0 mm electrode length
Context: pristine Cu-HHTP unless noted
Measurement source: SI p013 · Table S1; Evaluation of electrical performances · Table S1; Fig. S21-S24

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
electrical conductivity	0.2201 S cm-1	—	—	SI Table Exact Reported	SI p013 · Table S1 · Table S1

linear I-V conductivity

Electrical conductivity

Cu0.1 P2.0-20C · Thin Film

Electronic conductivity parallel to substrate from Os patterned electrodes in air at room temperature.

Atmosphere: air
Geometry: parallel Os electrodes; 0.5 mm gap; 3.0 mm electrode length
Context: pristine Cu-HHTP unless noted
Measurement source: SI p013 · Table S1; Evaluation of electrical performances · Table S1; Fig. S21-S24

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
electrical conductivity	0.1418 S cm-1	—	—	SI Table Exact Reported	SI p013 · Table S1 · Table S1

linear I-V conductivity

Electrical conductivity

Cu0.1 P2.0-5C · Thin Film

Electronic conductivity parallel to substrate from Os patterned electrodes in air at room temperature.

Atmosphere: air
Geometry: parallel Os electrodes; 0.5 mm gap; 3.0 mm electrode length
Context: pristine Cu-HHTP unless noted
Measurement source: SI p013 · Table S1; Evaluation of electrical performances · Table S1; Fig. S21-S24

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
electrical conductivity	0.02021 S cm-1	—	—	SI Table Exact Reported	SI p013 · Table S1 · Table S1

linear I-V conductivity

Electrical conductivity

Cu0.1 P0.1-10C · Thin Film

Electronic conductivity parallel to substrate from Os patterned electrodes in air at room temperature.

Atmosphere: air
Geometry: parallel Os electrodes; 0.5 mm gap; 3.0 mm electrode length
Context: pristine Cu-HHTP unless noted
Measurement source: SI p013 · Table S1; Evaluation of electrical performances · Table S1; Fig. S21-S24

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
electrical conductivity	0.00158 S cm-1	—	—	SI Table Exact Reported	SI p013 · Table S1 · Table S1

linear I-V conductivity

Electrical conductivity

Cu0.1 P0.1-20C · Thin Film

Electronic conductivity parallel to substrate from Os patterned electrodes in air at room temperature.

Atmosphere: air
Geometry: parallel Os electrodes; 0.5 mm gap; 3.0 mm electrode length
Context: pristine Cu-HHTP unless noted
Measurement source: SI p013 · Table S1; Evaluation of electrical performances · Table S1; Fig. S21-S24

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
electrical conductivity	0.1750 S cm-1	—	—	SI Table Exact Reported	SI p013 · Table S1 · Table S1

linear I-V conductivity

Electrical conductivity

Cu0.1 P0.1-40C · Thin Film

Electronic conductivity parallel to substrate from Os patterned electrodes in air at room temperature.

Atmosphere: air
Geometry: parallel Os electrodes; 0.5 mm gap; 3.0 mm electrode length
Context: pristine Cu-HHTP unless noted
Measurement source: SI p013 · Table S1; Evaluation of electrical performances · Table S1; Fig. S21-S24

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
electrical conductivityMarked as a best value within this paper	0.6918 S cm-1	—	—	SI Table Exact Reported	SI p013 · Table S1 · Table S1

linear I-V conductivity

Electrical conductivity

Cu0.1 P0.1-5C · Thin Film

Electronic conductivity parallel to substrate from Os patterned electrodes in air at room temperature.

Atmosphere: air
Geometry: parallel Os electrodes; 0.5 mm gap; 3.0 mm electrode length
Context: pristine Cu-HHTP unless noted
Measurement source: SI p013 · Table S1; Evaluation of electrical performances · Table S1; Fig. S21-S24

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
electrical conductivity	5.454x10-5 S cm-1	—	—	SI Table Exact Reported	SI p013 · Table S1 · Table S1

linear I-V conductivity

Electrical conductivity

Cu1.0 P0.1-10C · Thin Film

Electronic conductivity parallel to substrate from Os patterned electrodes in air at room temperature.

Atmosphere: air
Geometry: parallel Os electrodes; 0.5 mm gap; 3.0 mm electrode length
Context: pristine Cu-HHTP unless noted
Measurement source: SI p013 · Table S1; Evaluation of electrical performances · Table S1; Fig. S21-S24

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
electrical conductivity	0.03041 S cm-1	—	—	SI Table Exact Reported	SI p013 · Table S1 · Table S1

linear I-V conductivity

Electrical conductivity

Cu1.0 P0.1-20C · Thin Film

Electronic conductivity parallel to substrate from Os patterned electrodes in air at room temperature.

Atmosphere: air
Geometry: parallel Os electrodes; 0.5 mm gap; 3.0 mm electrode length
Context: pristine Cu-HHTP unless noted
Measurement source: SI p013 · Table S1; Evaluation of electrical performances · Table S1; Fig. S21-S24

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
electrical conductivity	0.3777 S cm-1	—	—	SI Table Exact Reported	SI p013 · Table S1 · Table S1

linear I-V conductivity

Electrical conductivity

Cu1.0 P0.1-40C · Thin Film

Electronic conductivity parallel to substrate from Os patterned electrodes in air at room temperature.

Atmosphere: air
Geometry: parallel Os electrodes; 0.5 mm gap; 3.0 mm electrode length
Context: pristine Cu-HHTP unless noted
Measurement source: SI p013 · Table S1; Evaluation of electrical performances · Table S1; Fig. S21-S24

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
electrical conductivity	0.5080 S cm-1	—	—	SI Table Exact Reported	SI p013 · Table S1 · Table S1

linear I-V conductivity

Electrical conductivity

Cu1.0 P0.1-5C · Thin Film

Electronic conductivity parallel to substrate from Os patterned electrodes in air at room temperature.

Atmosphere: air
Geometry: parallel Os electrodes; 0.5 mm gap; 3.0 mm electrode length
Context: pristine Cu-HHTP unless noted
Measurement source: SI p013 · Table S1; Evaluation of electrical performances · Table S1; Fig. S21-S24

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
electrical conductivity	0.00912 S cm-1	—	—	SI Table Exact Reported	SI p013 · Table S1 · Table S1