Microscopy Morphology — Growth mechanisms and anisotropic softness-dependent conductivity of orientation-controllable metal-organic framework nanofilms

17 measurement groups · 21 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

AFM thickness measurement

Atomic force microscopy

Cu0.1 P1.0-10C · Thin Film

Thickness from AFM step-height/curves; tabulated in SI Table S1.

Context: pristine Cu-HHTP unless noted
Measurement source: SI p013 · Table S1 · Table S1

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
film thickness	40.2 nm	—	—	SI Table Exact Reported	SI p013 · Table S1 · Table S1

AFM thickness measurement

Atomic force microscopy

Cu0.1 P1.0-20C · Thin Film

Thickness from AFM step-height/curves; tabulated in SI Table S1.

Context: pristine Cu-HHTP unless noted
Measurement source: SI p013 · Table S1 · Table S1

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
film thickness	96.2 nm	—	—	SI Table Exact Reported	SI p013 · Table S1 · Table S1

AFM thickness measurement

Atomic force microscopy

Cu0.1 P1.0-5C · Thin Film

Thickness from AFM step-height/curves; tabulated in SI Table S1.

Context: pristine Cu-HHTP unless noted
Measurement source: SI p013 · Table S1 · Table S1

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
film thickness	18.5 nm	—	—	SI Table Exact Reported	SI p013 · Table S1 · Table S1

AFM thickness measurement

Atomic force microscopy

Cu0.1 P2.0-10C · Thin Film

Thickness from AFM step-height/curves; tabulated in SI Table S1.

Context: pristine Cu-HHTP unless noted
Measurement source: SI p013 · Table S1 · Table S1

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
film thickness	33.3 nm	—	—	SI Table Exact Reported	SI p013 · Table S1 · Table S1

AFM thickness measurement

Atomic force microscopy

Cu0.1 P2.0-20C · Thin Film

Thickness from AFM step-height/curves; tabulated in SI Table S1.

Context: pristine Cu-HHTP unless noted
Measurement source: SI p013 · Table S1 · Table S1

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
film thickness	51.8 nm	—	—	SI Table Exact Reported	SI p013 · Table S1 · Table S1

AFM thickness measurement

Atomic force microscopy

Cu0.1 P2.0-5C · Thin Film

Thickness from AFM step-height/curves; tabulated in SI Table S1.

Context: pristine Cu-HHTP unless noted
Measurement source: SI p013 · Table S1 · Table S1

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
film thickness	13.4 +/- 2.3 nm	—	+/- 2.3 nm	SI Table Rounded Reported	SI p013 · Table S1 · Table S1

AFM thickness measurement

Atomic force microscopy

Cu0.1 P0.1-10C · Thin Film

Thickness from AFM step-height/curves; tabulated in SI Table S1.

Context: pristine Cu-HHTP unless noted
Measurement source: SI p013 · Table S1 · Table S1

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
film thickness	18.4 nm	—	—	SI Table Exact Reported	SI p013 · Table S1 · Table S1

AFM thickness measurement

Atomic force microscopy

Cu0.1 P0.1-20C · Thin Film

Thickness from AFM step-height/curves; tabulated in SI Table S1.

Context: pristine Cu-HHTP unless noted
Measurement source: SI p013 · Table S1 · Table S1

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
film thickness	37.8 nm	—	—	SI Table Exact Reported	SI p013 · Table S1 · Table S1

AFM thickness measurement

Atomic force microscopy

Cu0.1 P0.1-40C · Thin Film

Thickness from AFM step-height/curves; tabulated in SI Table S1.

Context: pristine Cu-HHTP unless noted
Measurement source: SI p013 · Table S1 · Table S1

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
film thickness	103.7 nm	—	—	SI Table Exact Reported	SI p013 · Table S1 · Table S1

AFM thickness measurement

Atomic force microscopy

Cu0.1 P0.1-5C · Thin Film

Thickness from AFM step-height/curves; tabulated in SI Table S1.

Context: pristine Cu-HHTP unless noted
Measurement source: SI p013 · Table S1 · Table S1

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
film thickness	11.0 nm	—	—	SI Table Exact Reported	SI p013 · Table S1 · Table S1

AFM thickness measurement

Atomic force microscopy

Cu1.0 P0.1-10C · Thin Film

Thickness from AFM step-height/curves; tabulated in SI Table S1.

Context: pristine Cu-HHTP unless noted
Measurement source: SI p013 · Table S1 · Table S1

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
film thickness	40.3 nm	—	—	SI Table Exact Reported	SI p013 · Table S1 · Table S1

AFM thickness measurement

Atomic force microscopy

Cu1.0 P0.1-20C · Thin Film

Thickness from AFM step-height/curves; tabulated in SI Table S1.

Context: pristine Cu-HHTP unless noted
Measurement source: SI p013 · Table S1 · Table S1

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
film thickness	78.2 nm	—	—	SI Table Exact Reported	SI p013 · Table S1 · Table S1

AFM thickness measurement

Atomic force microscopy

Cu1.0 P0.1-40C · Thin Film

Thickness from AFM step-height/curves; tabulated in SI Table S1.

Context: pristine Cu-HHTP unless noted
Measurement source: SI p013 · Table S1 · Table S1

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
film thickness	157.6 nm	—	—	SI Table Exact Reported	SI p013 · Table S1 · Table S1

AFM thickness measurement

Atomic force microscopy

Cu1.0 P0.1-5C · Thin Film

Thickness from AFM step-height/curves; tabulated in SI Table S1.

Context: pristine Cu-HHTP unless noted
Measurement source: SI p013 · Table S1 · Table S1

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
film thickness	17.5 nm	—	—	SI Table Exact Reported	SI p013 · Table S1 · Table S1

FM-AFM in ultrapure water

Atomic force microscopy

Cu0.1 P2.0-2C · Thin Film

Molecule-level imaging of 2-cycle edge-on Cu-HHTP on mica under aqueous interface.

Temperature: 298
Atmosphere: ultrapure water
Context: pristine Cu-HHTP unless noted
Measurement source: p004 · Direct Imaging · Fig. 4C; SI Fig. S26-S29

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
observed 1D channel spacings	observed about 2.0, 1.3, 0.9 and 1.5 nm	—	—	Figure Axis Approximate	SI p033 · Fig. S29 · Fig. S29
edge-on nanograin lateral size	10 to 30 nm	—	—	Text Range	p004 · Direct Imaging · Fig. 4C; SI Fig. S25-S28
edge-on FM-AFM height drop	about 4 nm	—	—	Text Approximate	p004 · Direct Imaging · Fig. 4C

FM-AFM in ultrapure water

Atomic force microscopy

Cu0.1 P0.1-2C · Thin Film

Molecule-level imaging of 2-cycle face-on Cu-HHTP on mica under aqueous interface.

Temperature: 298
Atmosphere: ultrapure water
Context: pristine Cu-HHTP unless noted
Measurement source: p004 · Direct Imaging · Fig. 4B; SI Fig. S26

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
face-on top-surface lattice observation	top-surface lattice difficult to observe; bottom honeycomb-like lattice after peeling	—	—	Text Qualitative	p004 · Direct Imaging · Fig. 4B; SI Fig. S26

AFM thickness-vs-cycle analysis

Atomic force microscopy

face-on Cu0.1 P0.1-xC series · Thin Film

Growth-rate comparison for face-on films from AFM thickness data.

Context: pristine Cu-HHTP unless noted
Measurement source: p003 · Cycle-Dependent Properties · SI Fig. S9-S17

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Cu0.1 P0.1 growth rate	~2 nm per cycle	—	—	Text Approximate	p003 · Cycle-Dependent Properties · SI Fig. S9-S17
Cu1.0 P0.1 growth rate	~4 nm per cycle	—	—	Text Approximate	p003 · Cycle-Dependent Properties · SI Fig. S9-S17
Cu-HHTP nanofilm roughness	<10 nm	—	—	Text Approximate	p003 · Cycle-Dependent Properties · SI Fig. S9-S17