TEM plus Cu K-edge XAFS/EXAFS
Cu0.1 P2.0-20C · Thin Film
Lattice spacings and orientation-dependent fluorescence XAFS for films of similar thickness.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| edge-on (002) spacing | ~0.31-0.33 nm | — | — | Text Range | SI p008 · Fig. S5 text · Fig. S5 |
| TEM visible channel spacing | ~1.8 nm for (100)/(010) | — | — | Text Approximate | SI p008 · Fig. S5 text · Fig. S5 |
| edge-on EXAFS stronger k range | stronger signals at k = 3-7 A-1 | — | — | Text Range | SI p008 · Fig. S5 text · Fig. S5-S8 |
| dominant Cu(II) XANES feature | dominant Cu(II) peak above 8985 eV | — | — | Text Approximate | SI p008 · Fig. S5 text · Fig. S6 |