Grazing-incidence X-ray diffraction (GIXRD) and Williamson-Hall analysis
Pristine Cu3(HHTP)2 thin film · Thin Film
In-plane and out-of-plane GIXRD; SI specifies a 150 nm-thick Cu3(HHTP)2 film on glass and incidence angle 0.4 deg in Methods.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| Williamson-Hall crystallite size | ~28 nm | — | — | Text Approximate | main p.2 · Microfabrication of MOFECTs · fig. S1B |
| Out-of-plane GIXRD peak for (002) | 2theta = 28.0 deg, assigned to (002) | — | — | Text Rounded Reported | main p.2 · Microfabrication of MOFECTs · fig. S1A |
| In-plane GIXRD peak for (100) | 2theta = 4.6 deg, assigned to (100) | — | — | Text Rounded Reported | main p.2 · Microfabrication of MOFECTs · fig. S1A |
| In-plane GIXRD peak for (200) | 2theta = 9.4 deg, assigned to (200) | — | — | Text Rounded Reported | main p.2 · Microfabrication of MOFECTs · fig. S1A |
| In-plane GIXRD peak for (210) | 2theta = 12.6 deg, assigned to (210) | — | — | Text Rounded Reported | main p.2 · Microfabrication of MOFECTs · fig. S1A |
| Williamson-Hall y-intercept | 0.005 | — | — | Caption Exact Reported | SI p.2 · Fig. S1 caption · Fig. S1 |