cMOF Evidence Base
Microscopy Morphology — 2D metal-organic frameworks for ultraflexible electrochemical transistors with high transconductance and fast response speeds

Measurement evidence

Microscopy Morphology

2D metal-organic frameworks for ultraflexible electrochemical transistors with high transconductance and fast response speeds · Song J., Liu H., Zhao Z. et al. · Science Advances · 2023 · eadd9627

3 measurement groups · 9 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

HRTEM, FFT, STEM-EELS mapping

Transmission electron microscopy

Pristine Cu3(HHTP)2 thin film · Thin Film

Cu3(HHTP)2 thin films peeled off from substrates; EELS maps C, Cu and O.

Geometry
Peeled thin film
Context
pristine_framework
Measurement source
main p.2 · Microfabrication of MOFECTs · Fig. 1B; fig. S2
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
Elemental uniformity by EELSUniform C, Cu and O distribution across the film——Text
Qualitative		main p.2 · Microfabrication of MOFECTs · fig. S2
Hexagonal nanopore lattice spacing~1.9 nm——Text
Approximate		main p.2 · Microfabrication of MOFECTs · Fig. 1B

SEM, AFM and surface profilometry

Scanning electron microscopyAtomic force microscopy

Pristine Cu3(HHTP)2 thin film · Thin Film

Film morphology, roughness and thickness as a function of layer-by-layer growth cycles.

Geometry
Cu3(HHTP)2 films with 5-20 growth cycles
Context
pristine_framework
Measurement source
main p.2 · Microfabrication of MOFECTs · figs. S3-S5
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
Average roughness for 50 nm film~7.97 nm——Caption
Approximate		SI p.4 · Fig. S3 caption · Fig. S3
Film-thickness growth rate per layer-by-layer cycleabout 10 nm per cycle——Text
Approximate		main p.2 · Microfabrication of MOFECTs · fig. S4
Roughness increase per growth cycleslope = 0.15 nm/cycle——Figure Axis
Rounded Reported		SI p.6 · Fig. S5 · Fig. S5D
Film thickness after 20 growth cycles200 nm——Figure Axis
Rounded Reported		SI p.5 · Fig. S4 · Fig. S4D
Film thickness after 5 growth cycles48 nm——Figure Axis
Rounded Reported		SI p.5 · Fig. S4 · Fig. S4A

AFM thickness comparison before and during aqueous electrolyte exposure

Atomic force microscopy

Pristine Cu3(HHTP)2 thin film · Thin Film

Dry Cu3(HHTP)2 film versus film characterized in 0.05 M CaCl2 aqueous solution.

Geometry
approximately 125 nm Cu3(HHTP)2 film
Context
pristine framework in electrolyte
Measurement source
SI p.19 · Fig. S18 · Fig. S18
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
Dry film thickness before swelling test~127 nm——Caption
Approximate		SI p.19 · Fig. S18 caption · Fig. S18A
Film thickness in aqueous CaCl2~124 nm——Caption
Approximate		SI p.19 · Fig. S18 caption · Fig. S18B