Diffraction Structure — Mutually Noninterfering Flexible Pressure-Temperature Dual-Modal Sensors Based on Conductive Metal-Organic Framework for Electronic Skin

Measurement evidence

Diffraction Structure

Mutually Noninterfering Flexible Pressure-Temperature Dual-Modal Sensors Based on Conductive Metal-Organic Framework for Electronic Skin · Li Y., Wang R., Wang G.-E. et al. · ACS Nano · 2022 · 473-484

1 measurement group · 1 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

High-resolution multifunction X-ray diffractometer (D8 Discover Davinci)

X-ray diffraction and scattering

MOF-MSMC-5h composite film/sensor · Thin Film

phase composition/crystalline structure of Ni3(HiTP)2 grown onto MSMC

Context: composite target film
Measurement source: 2 · Supporting Figures · Figure S1

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Ni3(HiTP)2 XRD pattern on MSMC	XRD pattern shown; no peak positions tabulated	—	—	Qualitative Qualitative	2 · Figure S1