HR-TEM, TEM, and SAED, JEOL 2100F TEM
Ag5BHT thin films · Thin Film
TEM/HR-TEM/SAED at 120 kV per SI characterisation conditions.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| HR-TEM lattice fringe d-spacing 2 | d = 4.6 A | — | — | Text Rounded Reported | 8722 · Results · Fig. 2d |
| HR-TEM lattice fringe d-spacing 1 | d = 7.7 A | — | — | Text Rounded Reported | 8722 · Results · Fig. 2d |
| SAED pattern assignment | regularly spaced diffraction spots assignable to crystal indices | — | — | Text Qualitative | 8722 · Results · Fig. 2e |