Diffraction Structure — A Dual-Ligand Porous Coordination Polymer Chemiresistor with Modulated Conductivity and Porosity

Measurement evidence

Diffraction Structure

A Dual-Ligand Porous Coordination Polymer Chemiresistor with Modulated Conductivity and Porosity · Yao M.-S., Zheng J.-J., Wu A.-Q. et al. · Angewandte Chemie - International Edition · 2020 · 172-176

1 measurement group · 7 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

Synchrotron powder X-ray diffraction with Pawley refinement; beamline O2B2 at SPring-8

Cu3(HHTP)(THQ) nanowire black powder · Powder

PXRD wavelength 0.79962 Angstrom; 2theta range 2.09999-30.00000 deg; room temperature.

Temperature
298
Context
pristine dual-ligand MOF powder
Measurement source
5 · Table S1 · Table S1
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
Unit-cell a parameter17.1152625 AngstromSI Table
Exact Reported
5 · Table S1 · Table S1
Unit-cell b parameter17.1152625 AngstromSI Table
Exact Reported
5 · Table S1 · Table S1
Unit-cell c parameter6.2601220 AngstromSI Table
Exact Reported
5 · Table S1 · Table S1
Unit-cell volume1588.10992 Angstrom^3SI Table
Exact Reported
5 · Table S1 · Table S1
Crystal systemTrigonalSI Table
Exact Reported
5 · Table S1 · Table S1
Pawley/Rietveld weighted profile R factorRwp = 4.73SI Table
Exact Reported
5 · Table S1 · Table S1
Space groupP3m1SI Table
Exact Reported
5 · Table S1 · Table S1