IR spectroscopy and PXRD before/after NH3 exposure
Cu3(HHTP)(THQ) nanowire thick-film gas sensor · Thin Film
IR spectra and PXRD patterns measured before and after exposure to NH3; O2 pressure PXRD comparison in SI.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| IR evidence for NH3-framework interaction | IR peaks assigned to NH3-Cu+ and NH3-Cu2+ plus red shift of C=O | — | — | Qualitative Qualitative | 175 · Results and discussion · Figure 4c |
| NH3-induced lattice expansion | PXRD patterns show lattice expansion upon NH3 adsorption | — | — | Qualitative Qualitative | 175 · Results and discussion · Figure 4d |
| O2 comparison lattice response | No lattice expansion observed with O2 | — | — | Text Qualitative | 175 · Results and discussion · Figure S18 |