Electrical Transport — Interconnected Lamellar 3D Semiconductive PCP for Rechargeable Aqueous Zinc Battery Cathodes

Measurement evidence

Electrical Transport

Interconnected Lamellar 3D Semiconductive PCP for Rechargeable Aqueous Zinc Battery Cathodes · Lin Z., Otake K.-I., Kajiwara T. et al. · Small · 2025 · 2411386

3 measurement groups · 32 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

Two-probe electrochemical impedance spectroscopy (EIS)

Pressed VO-HHTP pellet · Pellet

Pressed pellet measured at 25-80 C; equivalent circuit with parallel C1 and R1.

Temperature
298-353
Atmosphere
oven-controlled environment
Geometry
5 mm diameter, 0.346 mm thick pellet clamped by gold contacts
Context
pristine framework pellet
Measurement source
p.5 / article p.2411386-5 · Results and Discussion · Figure 3b,c; Tables S3-S4
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
Arrhenius activation energy from EISEa = 0.523 eVFigure Axis
Rounded Reported
p.5 / article p.2411386-5 · Results and Discussion · Figure 3c
Fitted C1 at 25 C16.6 pFSI Table
Exact Reported
SI p.14 / rendered p015 · Supporting tables · Table S3
Fitted C1 at 30 C13.54 pFSI Table
Exact Reported
SI p.14 / rendered p015 · Supporting tables · Table S3
Fitted C1 at 40 C13.87 pFSI Table
Exact Reported
SI p.14 / rendered p015 · Supporting tables · Table S3
Fitted C1 at 50 C14.5 pFSI Table
Exact Reported
SI p.14 / rendered p015 · Supporting tables · Table S3
Fitted C1 at 60 C14.82 pFSI Table
Exact Reported
SI p.14 / rendered p015 · Supporting tables · Table S3
Fitted C1 at 70 C14.96 pFSI Table
Exact Reported
SI p.14 / rendered p015 · Supporting tables · Table S3
Fitted C1 at 80 C15.36 pFSI Table
Exact Reported
SI p.14 / rendered p015 · Supporting tables · Table S3
EIS conductivity at 25 CMarked as a best value within this paper4.15e-07 S cm-1SI Table
Exact Reported
SI p.14 / rendered p015 · Supporting tables · Table S4
EIS conductivity at 30 C5.81e-07 S cm-1SI Table
Exact Reported
SI p.14 / rendered p015 · Supporting tables · Table S4
EIS conductivity at 40 C1.22e-06 S cm-1SI Table
Exact Reported
SI p.14 / rendered p015 · Supporting tables · Table S4
EIS conductivity at 50 C2.18e-06 S cm-1SI Table
Exact Reported
SI p.14 / rendered p015 · Supporting tables · Table S4
EIS conductivity at 60 C4.45e-06 S cm-1SI Table
Exact Reported
SI p.14 / rendered p015 · Supporting tables · Table S4
EIS conductivity at 70 C6.48e-06 S cm-1SI Table
Exact Reported
SI p.14 / rendered p015 · Supporting tables · Table S4
EIS conductivity at 80 C8.86e-06 S cm-1SI Table
Exact Reported
SI p.14 / rendered p015 · Supporting tables · Table S4
Fitted R1 at 25 C0.5341 MOhmSI Table
Exact Reported
SI p.14 / rendered p015 · Supporting tables · Table S3
Fitted R1 at 30 C0.3032 MOhmSI Table
Exact Reported
SI p.14 / rendered p015 · Supporting tables · Table S3
Fitted R1 at 40 C0.1438 MOhmSI Table
Exact Reported
SI p.14 / rendered p015 · Supporting tables · Table S3
Fitted R1 at 50 C0.0809 MOhmSI Table
Exact Reported
SI p.14 / rendered p015 · Supporting tables · Table S3
Fitted R1 at 60 C0.0396 MOhmSI Table
Exact Reported
SI p.14 / rendered p015 · Supporting tables · Table S3
Fitted R1 at 70 C0.0272 MOhmSI Table
Exact Reported
SI p.14 / rendered p015 · Supporting tables · Table S3
Fitted R1 at 80 C0.0199 MOhmSI Table
Exact Reported
SI p.14 / rendered p015 · Supporting tables · Table S3

Two-probe I-V method by CV

Pressed VO-HHTP pellet · Pellet

I-V curves from -1 V to 1 V at 2 mV s-1; conductivity calculated by Ohm law and pellet geometry.

Temperature
298-353
Atmosphere
oven-controlled environment
Geometry
5 mm diameter, 0.346 mm thick pellet clamped by gold contacts
Context
pristine framework pellet
Measurement source
SI p.17 / rendered p018 · Supporting discussion 2 · Equations S1-S5
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
Arrhenius activation energy from I-VEa = 0.524 eVFigure Axis
Rounded Reported
p.5 / article p.2411386-5 · Results and Discussion · Figure 3d
I-V conductivity at 25 C4.18e-07 S cm-1SI Table
Exact Reported
SI p.14 / rendered p015 · Supporting tables · Table S4
I-V conductivity at 30 C5.84e-07 S cm-1SI Table
Exact Reported
SI p.14 / rendered p015 · Supporting tables · Table S4
I-V conductivity at 40 C1.19e-06 S cm-1SI Table
Exact Reported
SI p.14 / rendered p015 · Supporting tables · Table S4
I-V conductivity at 50 C2.39e-06 S cm-1SI Table
Exact Reported
SI p.14 / rendered p015 · Supporting tables · Table S4
I-V conductivity at 60 C4.31e-06 S cm-1SI Table
Exact Reported
SI p.14 / rendered p015 · Supporting tables · Table S4
I-V conductivity at 70 C6.55e-06 S cm-1SI Table
Exact Reported
SI p.14 / rendered p015 · Supporting tables · Table S4
I-V conductivity at 80 C9e-06 S cm-1SI Table
Exact Reported
SI p.14 / rendered p015 · Supporting tables · Table S4
Two-probe blank test-system resistancearound 16 OhmText
Approximate
SI p.17 / rendered p018 · Supporting discussion 2 · Figure S24

UV-vis diffuse reflection spectroscopy with Tauc analysis

As-prepared VO-HHTP black powder · Powder

Optical bandgap used as semiconductor evidence.

Context
pristine framework powder
Measurement source
p.4-p.5 / article p.2411386-4 to 5 · Results and Discussion · Figure 3a
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
Optical bandgap<1.55 eVText
Approximate
p.5 / article p.2411386-5 · Results and Discussion · Figure 3a