Diffraction Structure — Electrochemical Capacitance Traces with Interlayer Spacing in Two-dimensional Conductive Metal–Organic Frameworks

4 measurement groups · 8 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

Bu-MOF as-synthesised powder · Powder

[001] reflections between 2theta = 23-28 degrees used for interlayer spacing; [100] reflection FWHM from SI table.

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
[100] FWHM	0.43 degrees	—	—	SI Table Exact Reported	10 · PXRD of as-synthesized MOFs · Table S1
interlayer spacing	3.69 Angstrom	—	—	Text Rounded Reported	2 · Results · Figure 1c

Et-MOF as-synthesised powder · Powder

[001] reflections between 2theta = 23-28 degrees used for interlayer spacing; [100] reflection FWHM from SI table.

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
[100] FWHM	0.57 degrees	—	—	SI Table Exact Reported	10 · PXRD of as-synthesized MOFs · Table S1
interlayer spacing	3.63 Angstrom	—	—	Text Rounded Reported	2 · Results · Figure 1c

H-MOF as-synthesised powder · Powder

[001] reflections between 2theta = 23-28 degrees used for interlayer spacing; [100] reflection FWHM from SI table.

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
[100] FWHM	0.40 degrees	—	—	SI Table Exact Reported	10 · PXRD of as-synthesized MOFs · Table S1
interlayer spacing	3.29 Angstrom	—	—	Text Rounded Reported	2 · Results · Figure 1c

Pent-MOF as-synthesised powder · Powder

[001] reflections between 2theta = 23-28 degrees used for interlayer spacing; [100] reflection FWHM from SI table.

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
[100] FWHM	0.51 degrees	—	—	SI Table Exact Reported	10 · PXRD of as-synthesized MOFs · Table S1
interlayer spacing	3.72 Angstrom	—	—	Text Rounded Reported	2 · Results · Figure 1c