cMOF Evidence Base
Diffraction Structure — Quasi Solid–Liquid Reaction Strategy to In Situ Synthesize the Conductive MOF Film with Ordered Submicron Macropores for Gas Sensing

Measurement evidence

Diffraction Structure

Quasi Solid–Liquid Reaction Strategy to In Situ Synthesize the Conductive MOF Film with Ordered Submicron Macropores for Gas Sensing · Miao M., Wang Z., Guo Z. et al. · Advanced Materials Interfaces · 2022 · 2101908

1 measurement group · 4 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

PXRD

X-ray diffraction and scattering

TOM-Cu3(HITP)2 film for spectroscopic characterisations · Thin Film

Rigaku SmartLab with Cu K alpha X-ray source; TOM-Cu3(HITP)2 film on quartz compared with ordinary Cu3(HITP)2 MOF.

Geometry
TOM film in square groove of quartz plate
Context
target film compared with pristine ordinary MOF control
Measurement source
p006 · 2.4 Spectroscopic Analysis · Figure 3g
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
PXRD Cu3(HITP)2 (001) peak27.6 deg——Text
Exact Reported		p006 · 2.4 Spectroscopic Analysis · Figure 3g
PXRD Cu3(HITP)2 (100) peak4.6 deg——Text
Exact Reported		p006 · 2.4 Spectroscopic Analysis · Figure 3g
PXRD Cu3(HITP)2 (200) peak9.5 deg——Text
Exact Reported		p006 · 2.4 Spectroscopic Analysis · Figure 3g
TOM film PXRD peak broadeningwider and weaker diffraction peaks imply smaller microcrystalline size and higher disorder——Text
Qualitative		p006 · 2.4 Spectroscopic Analysis · Figure 3g