Measurement evidence
Quasi Solid–Liquid Reaction Strategy to In Situ Synthesize the Conductive MOF Film with Ordered Submicron Macropores for Gas Sensing · Miao M., Wang Z., Guo Z. et al. · Advanced Materials Interfaces · 2022 · 2101908
Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.
TOM-Cu3(HITP)2 film for spectroscopic characterisations · Thin Film
AES Cu curves for TOM-Cu3(HITP)2 film and ordinary Cu3(HITP)2 MOF.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| AES Cu curve comparison | almost identical | — | — | Text Qualitative | p006 · 2.4 Spectroscopic Analysis · Figure S3 |
TOM-Cu3(HITP)2 film for spectroscopic characterisations · Thin Film
Oxford Instruments X-MaxN EDS coupled to SEM; SI Table S1.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| EDS carbon atomic percentage | 70.81 atomic % | — | — | SI Table Exact Reported | p003 · Supporting Information · Table S1 |
| EDS carbon weight percentage | 54.88 weight % | — | — | SI Table Exact Reported | p003 · Supporting Information · Table S1 |
| EDS copper atomic percentage | 5.85 atomic % | — | — | SI Table Exact Reported | p003 · Supporting Information · Table S1 |
| EDS copper weight percentage | 24.01 weight % | — | — | SI Table Exact Reported | p003 · Supporting Information · Table S1 |
| EDS nitrogen atomic percentage | 23.34 atomic % | — | — | SI Table Exact Reported | p003 · Supporting Information · Table S1 |
| EDS nitrogen weight percentage | 21.11 weight % | — | — | SI Table Exact Reported | p003 · Supporting Information · Table S1 |
| EDS C:N:Cu stoichiometric ratio | about 12:4:1 | — | — | Text Approximate | p006 · 2.4 Spectroscopic Analysis · Table S1 |
Ordinary Cu3(HITP)2 MOF comparison · Powder
Comparison XPS curves for ordinary Cu3(HITP)2 MOF.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| Ordinary MOF XPS comparison | almost the same positions, shapes and fitting results as TOM-Cu3(HITP)2 film | — | — | Text Qualitative | p006 · 2.4 Spectroscopic Analysis · Figure 3d-f |
TOM-Cu3(HITP)2 film for spectroscopic characterisations · Thin Film
ThermoFisher ESCALAB Xi+ with monochromatised micro-focusing Al K alpha source; C 1s referenced to 284.8 eV.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| C=C binding energy | 284.8 eV | — | — | Text Exact Reported | p005 · 2.4 Spectroscopic Analysis · Figure 3c |
| C-N binding energy | 286.5 eV | — | — | Text Exact Reported | p005 · 2.4 Spectroscopic Analysis · Figure 3c |
| C-NH binding energy | 402.7 eV | — | — | Text Exact Reported | p005 · 2.4 Spectroscopic Analysis · Figure 3b |
| Cu(II) 2p1/2 binding energy | 954.2 eV | — | — | Text Exact Reported | p005 · 2.4 Spectroscopic Analysis · Figure 3a |
| Cu(II) 2p3/2 binding energy | 934.3 eV | — | — | Text Exact Reported | p005 · 2.4 Spectroscopic Analysis · Figure 3a |
| Cu(I) 2p1/2 binding energy | 952.6 eV | — | — | Text Exact Reported | p005 · 2.4 Spectroscopic Analysis · Figure 3a |
| Cu(I) 2p3/2 binding energy | 932.6 eV | — | — | Text Exact Reported | p005 · 2.4 Spectroscopic Analysis · Figure 3a |
| Cu 2p1/2 satellite binding energy | 962.8 eV | — | — | Text Exact Reported | p005 · 2.4 Spectroscopic Analysis · Figure 3a |
| Cu 2p3/2 satellite binding energy | 943.5 eV | — | — | Text Exact Reported | p005 · 2.4 Spectroscopic Analysis · Figure 3a |
| N-C binding energy | 399.3 eV | — | — | Text Exact Reported | p005 · 2.4 Spectroscopic Analysis · Figure 3b |
| N-Cu binding energy | 397.6 eV | — | — | Text Exact Reported | p005 · 2.4 Spectroscopic Analysis · Figure 3b |
| O-C=O binding energy | 288.8 eV | — | — | Text Exact Reported | p005 · 2.4 Spectroscopic Analysis · Figure 3c |