Powder X-ray diffraction (PXRD)
MF-cMOFQx/ty series · Nanosheet
PXRD of MF-cMOFQx/t5 and MF-cMOFQ1.28/ty series; compared with ST-cMOF and simulated patterns.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| Preferential (001) exposure by PXRDMarked as a best value within this paper | Significant increase in the (001)/(100) plane surface ratio for MF-cMOFQ1.28/t5 versus ST-cMOF | — | — | Qualitative Qualitative | 3 · 2.1 Synthesis and Characterization of cMOF · Figure 1c |
| Cu-HHTP characteristic PXRD peak positions | 4.6, 9.5, 12.6, and 27.7 degrees assigned to (100), (200), (210), and (001) | — | — | Text Exact Reported | 3 · 2.1 Synthesis and Characterization of cMOF · Figures S4-S5 |