Atomic force microscopy (AFM)
MF-cMOFQx/ty series · Nanosheet
AFM height profiles of MF-cMOFQx/t5 samples at 0.64, 1.28, 2.56, and 5.12 mL min^-1.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| MF-cMOFQ0.64/t5 AFM height label | 11 nm | — | — | Visual Estimate Approximate | 4 · Figure 2 · Figure 2q |
| MF-cMOFQ1.28/t5 AFM height label | 8 nm | — | — | Visual Estimate Approximate | 4 · Figure 2 · Figure 2r |
| MF-cMOFQ2.56/t5 AFM height label | 6 nm | — | — | Visual Estimate Approximate | 4 · Figure 2 · Figure 2s |
| MF-cMOFQ5.12/t5 AFM height labelMarked as a best value within this paper | 2 nm | — | — | Visual Estimate Approximate | 4 · Figure 2 · Figure 2t |