Cross-section SEM, TEM, HRTEM, selected-area electron diffraction and PXRD with DFT comparison
X-ray diffraction and scatteringElectron diffractionScanning electron microscopyTransmission electron microscopyDensity functional theory
Large-area free-standing Fe3(THT)2(NH4)3 multilayer film · Thin Film
Structural and morphological characterisation of free-standing/transferred films at room temperature.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| Film thickness after 72 h reaction | ~2 um for 72 reaction hours | — | — | Text Approximate | main p.2, article p.1028 · Synthesis and sample characterization · Fig. 1a |
| Hall-bar film thickness | 1.7 +/- 0.1 um | — | +/- 0.1 um | Caption Exact Reported | SI p.5/44 · Structural characterization · Fig. S1 |
| Interlayer distance | ~0.33 nm | — | — | Text Approximate | main p.2, article p.1028 · Synthesis and sample characterization · Fig. 1c |
| Honeycomb pore size | ~1.9 nm | — | — | Text Approximate | main p.2, article p.1028 · Synthesis and sample characterization · Fig. 1b; Fig. S2c |
| PXRD (001) stacking peak position | 2theta = 27.3 deg | — | — | Text Rounded Reported | main p.2, article p.1028 · Synthesis and sample characterization · Fig. 1c |
| PXRD (100) peak position | 2theta = 4.5 deg | — | — | Text Rounded Reported | main p.2, article p.1028 · Synthesis and sample characterization · Fig. 1c |
| PXRD (200) peak position | 2theta = 9.1 deg | — | — | Text Rounded Reported | main p.2, article p.1028 · Synthesis and sample characterization · Fig. 1c |
| In-plane unit-cell dimension from SAED | ~1.97 nm | — | — | Caption Approximate | SI p.6/44 · Structural characterization · Fig. S2 |