Diffraction Structure — High-mobility band-like charge transport in a semiconducting two-dimensional metal–organic framework

Measurement evidence

Diffraction Structure

High-mobility band-like charge transport in a semiconducting two-dimensional metal–organic framework · Dong R., Han P., Arora H. et al. · Nature Materials · 2018 · 1027-1032

1 measurement group · 8 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

Cross-section SEM, TEM, HRTEM, selected-area electron diffraction and PXRD with DFT comparison

Large-area free-standing Fe3(THT)2(NH4)3 multilayer film · Thin Film

Structural and morphological characterisation of free-standing/transferred films at room temperature.

Temperature
about 300
Geometry
Multilayer film.
Context
pristine framework
Measurement source
main p.2, article p.1028 · Synthesis and sample characterization · Fig. 1; Supplementary Figs. S1-S3
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
Film thickness after 72 h reaction~2 um for 72 reaction hoursText
Approximate
main p.2, article p.1028 · Synthesis and sample characterization · Fig. 1a
Hall-bar film thickness1.7 +/- 0.1 um+/- 0.1 umCaption
Exact Reported
SI p.5/44 · Structural characterization · Fig. S1
Interlayer distance~0.33 nmText
Approximate
main p.2, article p.1028 · Synthesis and sample characterization · Fig. 1c
Honeycomb pore size~1.9 nmText
Approximate
main p.2, article p.1028 · Synthesis and sample characterization · Fig. 1b; Fig. S2c
PXRD (001) stacking peak position2theta = 27.3 degText
Rounded Reported
main p.2, article p.1028 · Synthesis and sample characterization · Fig. 1c
PXRD (100) peak position2theta = 4.5 degText
Rounded Reported
main p.2, article p.1028 · Synthesis and sample characterization · Fig. 1c
PXRD (200) peak position2theta = 9.1 degText
Rounded Reported
main p.2, article p.1028 · Synthesis and sample characterization · Fig. 1c
In-plane unit-cell dimension from SAED~1.97 nmCaption
Approximate
SI p.6/44 · Structural characterization · Fig. S2