XPS, SEM-EDS, ATR-FTIR and elemental analysis
Large-area free-standing Fe3(THT)2(NH4)3 multilayer film · Thin Film
Composition and coordination analysis of Fe3(THT)2(NH4)3 films.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| Fe:S ratio by SEM-EDS | 0.9:4 | — | — | Caption Approximate | SI p.11/44 · Compositional analysis · Fig. S6 |
| Elemental analysis C found | 41.20% | — | — | SI Table Exact Reported | SI p.16/44 · Element analysis of MOF sample · Table S2 |
| Elemental analysis Fe found | 15.57% | — | — | SI Table Exact Reported | SI p.16/44 · Element analysis of MOF sample · Table S2 |
| Elemental analysis H found | 2.41% | — | — | SI Table Exact Reported | SI p.16/44 · Element analysis of MOF sample · Table S2 |
| Elemental analysis N found | 3.80% | — | — | SI Table Exact Reported | SI p.16/44 · Element analysis of MOF sample · Table S2 |
| Elemental analysis S found | 36.92% | — | — | SI Table Exact Reported | SI p.16/44 · Element analysis of MOF sample · Table S2 |
| THT S-H stretching band | 2516 cm-1; vanished in Fe3(THT)2 films | — | — | Caption Exact Reported | SI p.12/44 · Compositional analysis · Fig. S7 |
| Fe(II)/Fe(III) ratio limit from XPS | <= 1/1000 | — | XPS detection limit ~0.1% | Text Exact Reported | SI p.10/44 · Analysis of Fe(II)/Fe(III) ratio from XPS data · Fig. S5b |
| Fe:S ratio by XPS | 0.97:4 | — | — | Text Rounded Reported | SI p.9/44 · Compositional analysis · Fig. S5 |