Diffraction Structure — A two-dimensional π-d conjugated coordination polymer with extremely high electrical conductivity and ambipolar transport behaviour

Measurement evidence

Diffraction Structure

A two-dimensional π-d conjugated coordination polymer with extremely high electrical conductivity and ambipolar transport behaviour · Huang X., Sheng P., Tu Z. et al. · Nature Communications · 2015 · 7408

1 measurement group · 8 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

Synchrotron GIXRD and laboratory PXRD with Pawley refinement

X-ray diffraction and scattering

60 nm Cu-BHT film · Thin Film

Out-of-plane and in-plane GIXRD at Beijing Synchrotron Radiation Facility, lambda=1.5398 A, 2theta 5-40 deg, 0.05 deg increment, room temperature; PXRD with Cu Kalpha lambda=1.5406 A on ground films.

Temperature: room temperature
Context: pristine Cu-BHT 60 nm thin film
Measurement source: main p.3 and p.6 · Structural resolution / X-ray characterization and analysis · Fig. 2; Fig. 3

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Out-of-plane GIXRD primary peak	26.3 +/- 0.3 deg	—	+/-0.3 deg	Text Exact Reported	main p.2-3 · Structural resolution · Fig. 2b
In-plane domain size	16 nm	—	—	Text Rounded Reported	main p.2-3 · Structural resolution · Fig. 2a
In-plane hexagonal lattice parameter from GIXRD	a = b = 8.45 A	—	—	Text Rounded Reported	main p.2-3 · Structural resolution · Fig. 2a
Interlayer distance	3.38 +/- 0.03 A	—	+/-0.03 A	Text Exact Reported	main p.2-3 · Structural resolution · Fig. 2b
Crystalline domain size along c axis	Average size of 3 nm	—	—	Text Rounded Reported	main p.2-3 · Structural resolution · Fig. 2b
Pawley refinement Rwp for AA stacking	Rwp = 4.98%, Rp = 3.78%	—	—	Text Exact Reported	main p.6 · X-ray characterization and analysis · Fig. 3c
Pawley refinement Rwp for AB stacking	Rwp = 6.54%, Rp = 4.70%	—	—	Text Exact Reported	main p.6 · X-ray characterization and analysis · Fig. 3d
Orientation in films thicker than 200 nm	Films thicker than 200 nm show additional out-of-plane peaks indicating random oriented nanosheets.	—	—	Text Rounded Reported	main p.3 · Structural resolution · Supplementary Fig. 2