Electron probe microanalysis (EPMA), elemental analysis and XPS survey
General Cu-BHT thin-film samples · Thin Film
EPMA with JEOL JXA-8100; carbon content by Flash EA 1112; full XPS spectrum used to check residual reagent elements.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| Carbon weight percentage by elemental analysis | 16.4% | — | — | Text Exact Reported | main p.4 · Component analysis |
| Cu/S atom ratio from EPMA | about 0.54, close to 1:2 | — | — | Text Approximate | main p.4 · Component analysis · Supplementary Table 2 |
| Cu/S atom ratio sample 1 | 0.5481 | — | — | SI Table Exact Reported | SI p.5 · Supplementary Table 2 · Supplementary Table 2 |
| Cu/S atom ratio sample 2 | 0.5479 | — | — | SI Table Exact Reported | SI p.5 · Supplementary Table 2 · Supplementary Table 2 |
| Cu/S atom ratio sample 3 | 0.5383 | — | — | SI Table Exact Reported | SI p.5 · Supplementary Table 2 · Supplementary Table 2 |
| Residual starting-reagent elements in XPS survey | XPS verifies absence of sodium, chlorine, nitrogen and bromine. | — | — | Text Qualitative | main p.4 · Component analysis · Supplementary Fig. 5 |