SEM and AFM
General Cu-BHT thin-film samples · Thin Film
SEM on transferred films on conductive silicon with several-nanometre Pt coating; Hitachi S4800 SEM at 5 kV; AFM tapping mode with NanoScope IIIa.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| Downside roughness thickness trend | Roughness of downside surface increases with film thickness over 20-140 nm. | — | — | Text Qualitative | main p.2 · Synthesis of Cu-BHT films · Supplementary Fig. 1 |
| Cross-section nanosheet morphology | A 200 nm film contains plate-like sheets with thickness of several nanometres. | — | — | Text Rounded Reported | main p.2 · Synthesis of Cu-BHT films · Fig. 1e |
| Downside film morphology | Downside is rougher and matte black with random oriented plate-like nanosheets. | — | — | Text Qualitative | main p.2 · Synthesis of Cu-BHT films · Fig. 1d |
| Upside film morphology | Upside was flat with small roughness and continuous in large scale without steps or cracks. | — | — | Text Qualitative | main p.2 · Synthesis of Cu-BHT films · Fig. 1c |