cMOF Evidence Base
Microscopy Morphology — Electron delocalization and charge mobility as a function of reduction in a metal-organic framework

Measurement evidence

Microscopy Morphology

Electron delocalization and charge mobility as a function of reduction in a metal-organic framework · Aubrey M.L., Wiers B.M., Andrews S.C. et al. · Nature Materials · 2018 · 625-632

1 measurement group · 1 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

Scanning electron microscopy

Scanning electron microscopy

Fe2(BDP)3 single-microcrystal FET device · Single Crystal

SEM images of microcrystals and bonded devices; e-beam exposure stability check at 5.0 kV.

Geometry
acicular microcrystals on microelectrode arrays
Context
Pristine Fe2(BDP)3 microcrystals and devices.
Measurement source
main p.2, article p.626 · Fig. 1 caption and FET methods · Fig. 1d,e; Figs. S16-S18
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
As-synthesized Fe2(BDP)3 microcrystal length rangeless than 100 nm to greater than 20 um—range upper bound greater than 20 umText
Range		main p.5, article p.629 · Conductivity and charge mobility · Fig. 1d; Fig. S16