Synthesis evidence

Epitaxial Growth of MOF Thin Film for Modifying the Dielectric Layer in Organic Field-Effect Transistors

Gu Z.-G., Chen S.-C., Fu W.-Q. et al. · ACS Applied Materials and Interfaces · 2017 · 7259-7264

3 structured synthesis routes

Completeness describes how fully the route could be reconstructed from the main article and supporting information.

Partial recipeSource: Main

Route 1: Other

3 / 7261 · Results and discussion · Figure 3b

Metal precursorsCu(OAc)2 ethanolic solution (same conditions as SiO2/Si LPE)
Linker precursorsBTC ethanolic solution (same conditions as SiO2/Si LPE)
SolventsEthanol
AdditivesMUD-SAM functional layer on Au substrate
AtmosphereNot reported
TemperatureNot reported for LPE growth
TimeNot reported for individual immersion steps; ethanol ultrasonication rinse 60 s inferred from same conditions
Substrate orientationMUD-SAM-functionalized Au substrate; crystallographic orientation not reported
Oxidant / reductantNot reported
Work-upPrepared under same LPE conditions for IRRAS; detailed SAM preparation not supplied.
ActivationNot reported
Scalability contextUsed only as a spectroscopy substrate in the main text.
Show 4 structured reagent records
RoleReagentAmount / concentrationSource
Metal SourceCu(OAc)2same as SiO2/Si LPE; 1 mM reported for main LPE recipe3 / 7261 · Results and discussion · Figure 3b
LinkerBTCsame as SiO2/Si LPE; 0.1 mM reported for main LPE recipe3 / 7261 · Results and discussion · Figure 3b
SolventethanolNot specified3 / 7261 · Results and discussion · Figure 3b
AdditiveMUD-SAM on AuNot specified3 / 7261 · Results and discussion · Figure 3b
Partial recipeSource: Both

Route 2: Other

S-2 · Figure S1 caption · Figure S1

Metal precursorsCu(OAc)2 ethanolic solution (1 mM)
Linker precursorsBTC ethanolic solution (0.1 mM)
SolventsEthanol; pure ethanol rinse container
AdditivesKOH and H2O2 pretreatment to hydroxyl-functionalize SiO2/Si
AtmosphereNot reported
Temperature80 C for KOH/H2O2 pretreatment; LPE dipping temperature not reported
TimeKOH/H2O2 pretreatment 20 min; oxygen plasma 10 min; ethanol ultrasonication rinse 60 s between immersion steps; individual Cu/BTC immersion times not reported in main text
Substrate orientationSiO2/Si wafer; orientation not reported
Oxidant / reductantH2O2 in substrate pretreatment
Work-upUltrasonication treatment with pure ethanol for 60 s between immersion steps; repeated alternating immersion to one-, two-, three- and four-cycle films.
ActivationNot reported in main text
Scalability contextLayer-by-layer LPE cycles allow controlled thickness; no scale-up or area-yield data reported.
Show 5 structured reagent records
RoleReagentAmount / concentrationSource
Metal SourceCu(OAc)21 mMS-2 · Figure S1 caption · Figure S1
LinkerBTC0.1 mMS-2 · Figure S1 caption · Figure S1
Solventethanolpure ethanol rinse; ethanolic precursor solutionsS-2 · Figure S1 caption · Figure S1
BaseKOHKOH/H2O2 = 3:1 · 1 mMS-2 · Figure S1 caption · Figure S1
OxidantH2O2KOH/H2O2 = 3:1S-2 · Figure S1 caption · Figure S1
Partial recipeSource: Main

Route 3: Other

5 / 7263 · Experimental section · Device Fabrication and Characterization

Metal precursorsPreformed HKUST-1/SiO2/Si dielectric substrate; Au source/drain electrodes
Linker precursorsPTB7-Th semiconducting polymer
SolventsChlorobenzene for PTB7-Th spin-coating solution
AdditivesNone reported
AtmosphereNot reported for spin coating or Au deposition
TemperatureNot reported
TimeSpin coating 60 s; Au deposition time not reported
Substrate orientationHKUST-1/SiO2/Si or bare SiO2/Si; Si orientation not reported
Oxidant / reductantNone reported
Work-upPTB7-Th spin-coated at 3000 rpm from ~3 mg/mL chlorobenzene; Au source/drain electrodes ~50 nm vapour-deposited through a shadow mask.
ActivationNot reported
Scalability contextDevice geometry reported as channel width 6.0 mm and length 300 um; number of tested devices reported in Table 1.
Show 3 structured reagent records
RoleReagentAmount / concentrationSource
OtherPTB7-Th~3 mg mL-1 in chlorobenzene5 / 7263 · Experimental section · Device Fabrication and Characterization
SolventchlorobenzeneNot specified5 / 7263 · Experimental section · Device Fabrication and Characterization
OtherAu~50 nm source/drain electrodes5 / 7263 · Experimental section · Device Fabrication and Characterization