Diffraction Structure — Field-Effect Transistor Based on an in Situ Grown Metal-Organic Framework Film as a Liquid-Gated Sensing Device

Measurement evidence

Diffraction Structure

Field-Effect Transistor Based on an in Situ Grown Metal-Organic Framework Film as a Liquid-Gated Sensing Device · Wang B., Luo Y., Liu B. et al. · ACS Applied Materials and Interfaces · 2019 · 35935-35940

1 measurement group · 4 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

Powder X-ray diffraction (PXRD)

X-ray diffraction and scattering

Ni-MOF powder · Powder

PXRD comparison of Ni-MOF powders and films.

Context: pristine Ni-MOF powder/film
Measurement source: p003 / article p.35937 · Result and Discussion · Figure S2a

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
PXRD peak position	2theta = 12.5 degrees	—	—	Text Rounded Reported	p003 / article p.35937 · Result and Discussion · Figure S2a
PXRD peak position	2theta = 16.5 degrees	—	—	Text Rounded Reported	p003 / article p.35937 · Result and Discussion · Figure S2a
PXRD peak position	2theta = 4.7 degrees	—	—	Text Rounded Reported	p003 / article p.35937 · Result and Discussion · Figure S2a
PXRD peak position	2theta = 9.5 degrees	—	—	Text Rounded Reported	p003 / article p.35937 · Result and Discussion · Figure S2a