SEM, HRSEM, cross-sectional SEM, TEM, HRTEM, and elemental mapping
Ni-MOF-FET reacted for 60 min · Thin Film
Morphology and cross-sectional thickness of Ni-MOF films grown for 5, 15, 30, 60, and 120 min, including Au/no-Au comparisons.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| Au effect on MOF assembly | MOF grew more densely in the presence of gold | — | — | Text Qualitative | p004 / article p.35938 · Result and Discussion · Figure S4a,c,d,f |
| HRTEM crystallinity | HRTEM image showed a crystalline structure; inset displayed weak electron diffractions | — | — | Text Qualitative | p003 / article p.35937 · Result and Discussion · Figure 1d |
| film morphology | thin and stacked sheet-structures with excellent large-area and uniform film coverage | — | — | Text Qualitative | p003 / article p.35937 · Result and Discussion · Figure 1e-h |
| film thickness after 120 min with Au | approximately 703 nm from Figure S4e annotation | — | — | Visual Estimate Approximate | p006 / SI p.S-6 · Additional Figures · Figure S4e |
| film thickness after 15 min | approximately 316 nm from Figure 1j annotation | — | — | Visual Estimate Approximate | p002 / article p.35936 · Figure 1 · Figure 1j |
| film thickness after 30 min | approximately 392 nm from Figure 1k annotation | — | — | Visual Estimate Approximate | p002 / article p.35936 · Figure 1 · Figure 1k |
| film thickness after 5 min | about 191 nm | — | — | Text Approximate | p003 / article p.35937 · Result and Discussion · Figure 1i |
| film thickness after 60 min | about 516 nm | — | — | Text Approximate | p003 / article p.35937 · Result and Discussion · Figure 1l |
| film thickness after 60 min without Au | about 322 nm | — | — | Text Approximate | p004 / article p.35938 · Result and Discussion · Figure S4f |