X-ray photoelectron spectroscopy (XPS)
Ni-MOF-FET reacted for 60 min · Thin Film
XPS survey and high-resolution spectra of Ni-MOF film.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| C 1s binding energy | C 1s at 284.80 eV | — | — | Text Exact Reported | p003 / article p.35937 · Result and Discussion · Figure S2d |
| N 1s binding energy | N 1s at 399.22 eV | — | — | Text Exact Reported | p003 / article p.35937 · Result and Discussion · Figure S2b,d |
| Ni binding-energy peak | Ni 2s at 855.66 eV | — | — | Text Exact Reported | p003 / article p.35937 · Result and Discussion · Figure S2c,d |
| O 1s binding energy | O 1s at 534.04 eV | — | — | Text Exact Reported | p003 / article p.35937 · Result and Discussion · Figure S2d |