Diffraction Structure — Redox-Active Mixed-Linker Metal–Organic Frameworks with Switchable Semiconductive Characteristics for Tailorable Chemiresistive Sensing

Measurement evidence

Diffraction Structure

Redox-Active Mixed-Linker Metal–Organic Frameworks with Switchable Semiconductive Characteristics for Tailorable Chemiresistive Sensing · Zhou X.-C., Liu C., Su J. et al. · Angewandte Chemie - International Edition · 2023 · e202211850

3 measurement groups · 18 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

CIF crystallographic refinement data

Mn2[TTF]0.49[NiS4]0.51 single crystal · Single Crystal

Local CIF text for CCDC 2174846-like structure.

Temperature
296.15
Atmosphere
not specified in CIF
Geometry
single crystal
Context
pristine_framework
Measurement source
CIF · crystallographic data
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
CIF space groupP 65Text
Exact Reported
CIF · space group

Powder X-ray diffraction (PXRD)

Mn2[TTF]x[NiS4]1-x powder series · Powder

Room-temperature PXRD; Cu radiation; scan speed 0.1 s/step; solvent/vapour stability tests on Mn2[TTF]0.49[NiS4]0.51.

Temperature
room temperature
Atmosphere
ambient; solvent/vapour exposure for stability test
Geometry
powder
Context
pristine_framework
Measurement source
4 · Materials and Methods · Figure 2a; Figure S18
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
PXRD phase assignment across linker ratiossimilar peak positions; same structure as single-linker-based MOFsText
Qualitative
3 · Results and Discussion · Figure 2a
crystallinity retention after solvent/vapour exposuremaintains crystallinity in ethanol, acetone, and saturated water vapor for 24 hText
Exact Reported
3 · Results and Discussion · Figure 2e

Single-crystal X-ray diffraction; Bruker D8 Venture / PHOTON-100 CMOS, Mo Kalpha; SHELXTL refinement with PLATON SQUEEZE

Mn2[TTF]0.49[NiS4]0.51 single crystal · Single Crystal

Data collected under nitrogen cryoflow at 193 K according to SI methods; Table S1 reports refinement parameters at 296.15 K in the table/CIF.

Temperature
193 collection; 296.15 table/CIF
Atmosphere
nitrogen cryoflow
Geometry
single crystal 0.12 x 0.05 x 0.05 mm3
Context
pristine_framework
Measurement source
5 · X-ray Structure · Table S1
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
unit-cell a19.4039(7)SI Table
Exact Reported
26 · Table S1 · Table S1
unit-cell b19.4039(7)SI Table
Exact Reported
26 · Table S1 · Table S1
unit-cell c21.0208(7)SI Table
Exact Reported
26 · Table S1 · Table S1
one-dimensional channel size0.74 nmText
Rounded Reported
3 · Results and Discussion · Figure S11
crystal systemhexagonalSI Table
Exact Reported
26 · Table S1 · Table S1
CIF formula sumC32.96 H20 Mn2 Ni0.52 O10 S4SI Table
Exact Reported
26 · Table S1 · Table S1
unit-cell gamma120SI Table
Exact Reported
26 · Table S1 · Table S1
refined NiS4 fragment occupancy0.52Text
Rounded Reported
2 · Results and Discussion · Figure 1
R1 for I >= 2sigma(I)0.0538SI Table
Exact Reported
26 · Table S1 · Table S1
space groupP65SI Table
Exact Reported
26 · Table S1 · Table S1
shortest interligand S...S distanceca. 3.73 AText
Approximate
2 · Results and Discussion · Figure S4
refined TTF fragment occupancy0.48Text
Rounded Reported
2 · Results and Discussion · Figure 1
unit-cell volume6854.2(5)SI Table
Exact Reported
26 · Table S1 · Table S1
wR2 for I >= 2sigma(I)0.1149SI Table
Exact Reported
26 · Table S1 · Table S1
Z6SI Table
Exact Reported
26 · Table S1 · Table S1