cMOF Evidence Base
Microscopy Morphology — Redox-Active Mixed-Linker Metal–Organic Frameworks with Switchable Semiconductive Characteristics for Tailorable Chemiresistive Sensing

Measurement evidence

Microscopy Morphology

Redox-Active Mixed-Linker Metal–Organic Frameworks with Switchable Semiconductive Characteristics for Tailorable Chemiresistive Sensing · Zhou X.-C., Liu C., Su J. et al. · Angewandte Chemie - International Edition · 2023 · e202211850

1 measurement group · 3 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

SEM and EDX elemental mapping

Scanning electron microscopyElemental microanalysis and mapping

Mn2[TTF]0.49[NiS4]0.51 powder/crystals · Powder

Field-emission SEM (Hitachi-S4800) and EDX mapping of representative Mn2[TTF]0.49[NiS4]0.51 crystals.

Geometry
particles/crystals
Context
pristine_framework
Measurement source
3 · Results and Discussion · Figure 2c; Figures S5, S9, S10
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
EDX-derived TTF:NiS4 ratio for Mn2[TTF]0.49[NiS4]0.510.46:0.54——Text
Rounded Reported		3 · Results and Discussion · Figures S9-S10
microcrystalline particle width for device samplesca. 1 um——Text
Approximate		4 · Results and Discussion · Figures S18-S20
Mn2[TTF]0.49[NiS4]0.51 morphologyhexagonal prism particles——Caption
Qualitative		3 · Figure 2 caption · Figure 2c