| HHTP-only copper reaction controlresearch_0130__mat__mat_cu_hhtp_phase | Powder · Pristine Control · Pristine Framework | Sole addition of HHTP to copper ions in the interfacial system; slow nonconnected powder after 1 h.None | 3 · 2.1. Synthesis |
| Cu-HHTP-TCNQ film on glass chip with prepatterned gold electrodes, 45 minresearch_0130__mat__mat_cu_hhtp_tcnq | Electrode · Target Sample · Composite | Synthesised at 0 C for 45 min and deposited on gold-electrode chip; used for representative I-V and gas-response data.Glass/fused silica chip with Ti/Au electrodes and Al2O3 passivation · 403 +/- 40 nm for 45 min reaction time from SI Figure S3; device sensing sample also synthesised at 0 C for 45 min. | 6 · 2.6. Electrical Properties · Figure 4d,g |
| Cu-HHTP-TCNQ thin-film reaction-time seriesresearch_0130__mat__mat_cu_hhtp_tcnq | Thin Film · Target Sample · Composite | Interfacial film deposited by draining liquid phases, dried in air, washed with acetone and isopropyl alcohol, dried again in air.Freestanding at liquid-liquid interface; transferred to substrate of choice, including glass with prepatterned gold electrodes. · AFM line-profile labels in SI Figure S3: 123 +/- 9 nm (10 min), 210 +/- 15 nm (20 min), 189 +/- 15 nm (30 min), 403 +/- 40 nm (45 min), 391 +/- 41 nm (60 min), 355 +/- 75 nm (80 min). | 5 · Figure S3 · Figure S3 |
| Cu-HHTP-TCNQ film on silicon wafer for GI-SAXS, 40 minresearch_0130__mat__mat_cu_hhtp_tcnq | Thin Film · Target Sample · Composite | Synthesised by standard interfacial procedure at 0 C for 40 min and deposited onto plasma-treated silicon wafer.Silicon wafer, orientation (100), 500 um thick with 285 nm native SiO2 | 8 · Experimental Section / Grazing-Incidence Small-Angle X-Ray Scattering · Figure S7 |
| Cu-HHTP-TCNQ film on copper TEM grid, 40 minresearch_0130__mat__mat_cu_hhtp_tcnq | Thin Film · Target Sample · Composite | Synthesised by standard interfacial procedure at 0 C for 40 min and fished onto a copper grid.Copper TEM grid (G2400C, square 400 mesh, Cu 3.05 mm diameter) | 8 · Experimental Section / Transmission Electron Microscopy · Figure S6 |
| Merged Cu-HHTP-TCNQ film powder for XRDresearch_0130__mat__mat_cu_hhtp_tcnq | Powder · Target Sample · Composite | Repeated standard interfacial syntheses at 0 C for 45 min; films merged to obtain powder for XRD.None / powder collected from repeated syntheses | 8 · Experimental Section / X-Ray Diffraction · Figure 3f,g |