Synthesis evidence

Conductive Hybrid Cu-HHTP-TCNQ Metal–Organic Frameworks for Chemiresistive Sensing

Luder L., Gubicza A., Stiefel M. et al. · Advanced Electronic Materials · 2022 · 2100871

6 structured synthesis routes

Completeness describes how fully the route could be reconstructed from the main article and supporting information.

Complete recipeSource: Main

Route 1: Other

8 · Experimental Section / Fabrication of Chips with Prepatterned Electrodes · Figure 4a-c

Metal precursorsTi and Au evaporated electrodes
SolventsDimethylsulfoxide for lift-off; phosphoric acid for oxide etch
AdditivesAZ2020nlof and AZ1505 photoresists; Al2O3 passivation
Temperature110 soft bake; 55 oxide etch
TimeElectrode fabrication multistep; MOF film standard synthesis at 45 min for representative device
Substrate orientationFused silica/glass chip with central contacts and outer gold pads; Al2O3 insulating layer between chip and film.
Work-upUV lithography, Ti/Au evaporation, lift-off, plasma-enhanced ALD Al2O3, wet etching of contact/probe openings, wafer dicing.
Show 5 structured reagent records
RoleReagentAmount / concentrationSource
Otherfused silica wafer4 inches, 500 um thickness8 · Experimental Section / Fabrication of Chips with Prepatterned Electrodes · Figure 4a-c
OtherAZ2020nlof resistspin-coated 4000 rpm, 40 s8 · Experimental Section / Fabrication of Chips with Prepatterned Electrodes · Figure 4a-c
OtherTi/AuTi 5 nm; Au 50 nm8 · Experimental Section / Fabrication of Chips with Prepatterned Electrodes · Figure 4a-c
OtherAl2O350 nm · plasma-enhanced atomic layer deposition8 · Experimental Section / Fabrication of Chips with Prepatterned Electrodes · Figure 4a-c
Acidphosphoric acid85%, 55 C for 105 s · 85%8 · Experimental Section / Fabrication of Chips with Prepatterned Electrodes · Figure 4a-c
Vague recipeSource: Main

Route 2: Liquid Liquid Interface

3 · 2.1. Synthesis

Metal precursorsaqueous Cu(II) nitrate solution
Linker precursorsHHTP only; TCNQ omitted
Solventswater; ethyl acetate
Atmosphereargon-sealed vial, reaction at 0 C
Temperature0
Time1
Substrate orientationnone reported
Oxidant / reductantnone reported
Work-upnot reported for control powder
Activationnot reported
Scalability contextControl showed slow formation of nonconnected MOF powder after 1 h, not a continuous film.
Show 4 structured reagent records
RoleReagentAmount / concentrationSource
Metal SourceCu(II) nitrate solution2 mL · 10 mM3 · 2.1. Synthesis
LinkerHHTP1 mL in ethyl acetate · 0.4 mM3 · 2.1. Synthesis
Solventwater2 mL3 · 2.1. Synthesis
Solventethyl acetate1 mL3 · 2.1. Synthesis
Complete recipeSource: Both

Route 3: Liquid Liquid Interface

8 · Experimental Section / Grazing-Incidence Small-Angle X-Ray Scattering · Figure S7

Metal precursorsCu(NO3)2*xH2O
Linker precursorsHHTP; TCNQ
SolventsWater; ethyl acetate
AtmosphereArgon-filled sealed vial for standard procedure; GI-SAXS performed in vacuum (~0.01 mbar)
Temperature0
Time0.667
Substrate orientationDeposited onto Si(100) wafer, 500 um thick with 285 nm native SiO2; water rinse and 5 min air plasma before placement.
Work-upStandard interfacial film growth and deposition onto silicon wafer.
Complete recipeSource: Both

Route 4: Liquid Liquid Interface

8 · Experimental Section / Synthesis of Cu-HHTP-TCNQ Films · Figure 1; SI Video information

Metal precursorsCu(NO3)2*xH2O; aqueous Cu(II) nitrate solution
Linker precursorsHHTP in ethyl acetate; TCNQ in ethyl acetate
SolventsWater; ethyl acetate; acetone and isopropyl alcohol for washing
AtmosphereArgon-filled sealed vial; all solvents degassed with argon before use
Temperature0
Time0.167-1.333 (10-80 min series); visible within 1 min; black by 15 min
Substrate orientationSubstrate of choice placed at the bottom of vial before reaction; film sinks onto substrate when liquids are removed.
Work-upStop by carefully removing all liquid with a syringe; sink film onto substrate; dry in air; wash deposited film in acetone and isopropyl alcohol; dry again in air.
ActivationNo separate activation reported.
Scalability contextContinuously grown film lateral dimension defined by reaction vial, about 5 cm2.
Show 6 structured reagent records
RoleReagentAmount / concentrationSource
Metal SourceCu(NO3)2*xH2O2 mL · 10 mm aqueous Cu(II) nitrate solution8 · Experimental Section / Synthesis of Cu-HHTP-TCNQ Films · Figure 1; SI Video information
LinkerHHTP (Triphenylene-2,3,6,7,10,11-hexaol; 98%)1 mL solution · 0.4 mm in ethyl acetate8 · Experimental Section / Synthesis of Cu-HHTP-TCNQ Films · Figure 1; SI Video information
LinkerTCNQ (7,7,8,8-Tetracyanoquinodimethane)1 mL solution · 4 mm in ethyl acetate8 · Experimental Section / Synthesis of Cu-HHTP-TCNQ Films · Figure 1; SI Video information
Solventethyl acetatedegassed with argon8 · Experimental Section / Synthesis of Cu-HHTP-TCNQ Films · Figure 1; SI Video information
Solventacetonewash solvent8 · Experimental Section / Synthesis of Cu-HHTP-TCNQ Films · Figure 1; SI Video information
Solventisopropyl alcoholwash solvent8 · Experimental Section / Synthesis of Cu-HHTP-TCNQ Films · Figure 1; SI Video information
Complete recipeSource: Both

Route 5: Liquid Liquid Interface

8 · Experimental Section / Transmission Electron Microscopy · Figure S6

Metal precursorsCu(NO3)2*xH2O
Linker precursorsHHTP; TCNQ
SolventsWater; ethyl acetate
AtmosphereArgon-filled sealed vial for standard procedure
Temperature0
Time0.667
Substrate orientationFilm fished onto copper TEM grid
Work-upStandard interfacial film growth, then transfer to TEM grid.
Complete recipeSource: Main

Route 6: Liquid Liquid Interface

8 · Experimental Section / X-Ray Diffraction · Figure 3f,g

Metal precursorsCu(NO3)2*xH2O
Linker precursorsHHTP; TCNQ
SolventsWater; ethyl acetate
AtmosphereArgon-filled sealed vial for standard procedure
Temperature0
Time0.75
Substrate orientationRepeated films merged as powder for XRD
Work-upRepeated syntheses and subsequent merging to obtain larger powder amount.
Show 3 structured reagent records
RoleReagentAmount / concentrationSource
Metal SourceCu(NO3)2*xH2Ostandard interfacial procedure8 · Experimental Section / X-Ray Diffraction · Figure 3f,g
LinkerHHTPstandard interfacial procedure8 · Experimental Section / X-Ray Diffraction · Figure 3f,g
LinkerTCNQstandard interfacial procedure8 · Experimental Section / X-Ray Diffraction · Figure 3f,g