Diffraction Structure — Conductive Hybrid Cu-HHTP-TCNQ Metal–Organic Frameworks for Chemiresistive Sensing

3 measurement groups · 7 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

Transmission electron microscopy (TEM) and selected area electron diffraction (SAED)

Electron diffraction Transmission electron microscopy

Cu-HHTP-TCNQ film on copper TEM grid, 40 min · Thin Film

JEOL 2200FS, 200 keV, 0.3 s exposure; SAED camera lengths 100 and 60 cm.

Geometry: Film on copper TEM grid
Context: Hybrid film local crystallinity/amorphous character
Measurement source: 8 · Figure S6 · Figure S6

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
TEM/SAED crystallinity observation	Largely amorphous films; for the most part no diffraction peaks; occasional random SAED signals not assignable.	—	—	Text Qualitative	8 · Figure S6 caption · Figure S6

Powder X-ray diffraction (XRD)

X-ray diffraction and scattering

Merged Cu-HHTP-TCNQ film powder for XRD · Powder

PANALYTICAL X'pert Powder, CuKalpha source lambda = 1.5406 A, reflection mode, 60 h; background subtraction from sample-holder measurement.

Geometry: Powder from merged film syntheses
Context: Hybrid film powder with Cu-HHTP and Cu-TCNQ(I) phases
Measurement source: 8 · Experimental Section / X-Ray Diffraction · Figure 3f,g

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Cu-HHTP crystallite size from Scherrer analysis	12 nm for Cu-HHTP ((200)-reflection)	—	—	Text Rounded Reported	6 · 2.5. X-Ray Diffraction · Figure 3g
Cu-TCNQ(I) crystallite size from Scherrer analysis	24 nm for Cu-TCNQ(I) ((002)-reflection)	—	—	Text Rounded Reported	6 · 2.5. X-Ray Diffraction · Figure 3g
Cu-HHTP XRD reflections	Cu-HHTP reflections (100), (200), and (001) observed	—	—	Text Qualitative	5 · 2.5. X-Ray Diffraction · Figure 3f,g
Cu-TCNQ(I) XRD reflections	Cu-TCNQ(I) reflections (011), (002), (012), and (022) observed; no phase II features detected.	—	—	Text Qualitative	6 · 2.5. X-Ray Diffraction · Figure 3f,g
Amorphous contribution in XRD	Strong background signal representing high amorphous quantity of the sample.	—	—	Text Qualitative	6 · 2.5. X-Ray Diffraction · Figure 3f,g

Transmission XRD before/after washing and drying

X-ray diffraction and scattering

Merged Cu-HHTP-TCNQ film powder for XRD · Powder

Thin films synthesized by standard interfacial procedure at 0 C for 45 min, collected by loop holder, measured directly after synthesis and after washing/drying on STOE IPDS II with MoKalpha source.

Geometry: Loop sample holder; rotating sample, beam diameter 0.5 mm
Context: Hybrid film stability check
Measurement source: 8 · Experimental Section / X-Ray Diffraction

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
XRD stability after washing/drying	XRD pattern did not change after washing and drying compared to direct-after-synthesis signal.	—	—	Text Qualitative	6 · 2.5. X-Ray Diffraction