Four-point collinear current-voltage transport measurement
Cu-HHTP-TCNQ film on glass chip with prepatterned gold electrodes, 45 min · Electrode
Voltage swept linearly with amplitude 3 V at 12 V s^-1; current monitored by current amplifier; nonconducting devices below 1 nS excluded.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| Maximum contact spacing | s = 100 um | — | — | Text Exact Reported | 7 · 2.6. Electrical Properties · Figure 4a,f |
| Minimum contact spacing | s = 10 um | — | — | Text Exact Reported | 7 · 2.6. Electrical Properties · Figure 4a,f |
| Number of electrical contacts analysed | 206 contacts | — | — | Text Exact Reported | 7 · 2.6. Electrical Properties · Figure 4f |
| Representative film resistance in vacuum | 100.8 kOhm | — | — | Text Exact Reported | 7 · 2.6. Electrical Properties · Figure 4d |
| Mean conductivityMarked as a best value within this paper | sigma_mean = 0.033 +/- 0.006 S cm^-1 | — | +/- 0.006 S cm^-1 | Text Exact Reported | 7 · 2.6. Electrical Properties · Figure 4f |
| Highest outlier conductivity omitted from plot | one outlier at sigma = 0.306 S cm^-1 (time = 60 min, s = 20 um) | — | — | Caption Exact Reported | 6 · Figure 4 caption · Figure 4f |
| Nonconducting-device exclusion threshold | below threshold of 1 nS | — | — | Text Exact Reported | 8 · Experimental Section / Electrical Transport Measurements |