Grazing-incidence small-angle X-ray scattering (GI-SAXS)
Cu-HHTP-TCNQ film on silicon wafer for GI-SAXS, 40 min · Thin Film
Nanostar X-ray scattering system, CuKalpha lambda = 0.154 nm, incident grazing angles 0.15-0.3 deg, experiments in vacuum about 0.01 mbar.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| GI-SAXS intensity relative to silicon reference | roughly five times stronger than silicon substrate reference | — | — | Text Approximate | 6 · 2.5. X-Ray Diffraction · Figure S7 |
| GI-SAXS scattering q-range | strong scattering intensities in range 0.1-1 nm^-1 | — | range 0.1-1 nm^-1 | Text Range | 6 · 2.5. X-Ray Diffraction · Figure S7 |