Yang M., Tan J., Wang Z. et al. · Journal of the American Chemical Society · 2025 · 24152-24161
Open a family to keep every result attached to its sample, method and conditions.
Paraphrased for this database from the authors’ stated interpretations — never quoted verbatim — and kept separate from reported measurements.
Magnetic data show paramagnetic Cu2+ behaviour and no long-range magnetic ordering, although trace defect radicals cannot be ruled out.
Caveat: Authors explicitly note possible trace radicals from structural defects.
24156-24157 · Electronic Properties · Figures S41-S43 · Linked to 3 structured results
All three Cu-X-HHS MOFs are isoreticular two-dimensional wavy honeycomb frameworks with slipped stacking.
Caveat: Cu-S-HHS is MicroED-resolved; Cu-Se-HHS and Cu-Te-HHS are PXRD/Pawley and DFT-model supported.
24153-24154 · Structural Characterizations · Figures 2/S16 · Linked to 6 structured results
Increasing chalcogen atomic number from S to Se to Te gives a 10^2-10^4 increase in room-temperature pressed-pellet conductivity, with Cu-Te-HHS the best conductor.
Caveat: Pressed-pellet values include grain-boundary and contact effects; SI table gives a slightly different rounded Te value.
24157 · Electronic Properties · Figure 5b · Linked to 3 structured results
XPS and magnetic analyses indicate mixed Cu2+/Cu+ states and increasing ligand oxidation character across the chalcogen series.
Caveat: XPS is surface sensitive and SI states detected atomic ratios differ from theoretical values.
24155-24156 · Analysis of the Electronic Structure · Figures S37-S39 · Linked to 6 structured results
For Cu-S-HHS single crystals, in-plane conductivity exceeds out-of-plane conductivity, supporting pi-d conjugation as the dominant conduction pathway.
Caveat: Only Cu-S-HHS has reported in-plane single-crystal conductivity.
24157 · Electronic Properties · Figure 5c · Linked to 2 structured results
Cu-Te-HHS benefits from Te-mediated interlayer through-space charge transport in addition to conventional pi-pi stacking.
Caveat: Te-Se structures are modelled/refined rather than directly solved by MicroED; mechanism is inferred from DFT, UPS, THz and transport.
24159 · Theoretical Calculation · Figure 6g · Linked to 3 structured results
Low-temperature variable-temperature conductivity of Cu-Se-HHS and Cu-Te-HHS is consistent with three-dimensional Mott variable-range hopping.
Caveat: This applies to low-temperature regions and coexists with other conduction mechanisms.
24157 · Electronic Properties · Figure S53 · Linked to 2 structured results
Names and aliases are kept exactly within the paper’s own identity model.
| Material | Composition | Structure context | Source |
|---|---|---|---|
| Cu-S-HHS (copper hexahydroxytrithiasumanene MOF) | [Cu3(S-HHS)2]; empirical C36Cu3O12S6Cu ions / CuO4 secondary building units · hexahydroxytrithiasumanene (S-HHS) | 2D · Pristinetriclinic P-1 by MicroED; wavy honeycomb 2D layers with slipped-parallel stacking | 24153 · Results and Discussion · Figure 1e / Figure 2 |
| Cu-Se-HHS (copper hexahydroxytriselenasumanene MOF) | [Cu3(Se-HHS)2]; inferred empirical C36Cu3O12Se6Cu ions / CuO4 catecholate/semiquinone linkages · hexahydroxytriselenasumanene (Se-HHS) | 2D · Pristinetriclinic P-1 Pawley-refined slipped-AA′ model; wavy honeycomb 2D layers | 24154 · Results and Discussion · Figure 1e / Figure 2 |
| Cu-Te-HHS (copper hexahydroxytritellurasumanene MOF) | [Cu3(Te-HHS)2]; inferred empirical C36Cu3O12Te6Cu ions / CuO4 catecholate/semiquinone linkages · hexahydroxytritellurasumanene (Te-HHS) | 2D · Pristinetriclinic P-1 Pawley-refined slipped-AA′ model; wavy honeycomb 2D layers | 24154 · Results and Discussion · Figure 1e / Figure 2 |
Sample form, processing state and composition status define the context for measurements.
| Sample | Form and role | Processing and geometry | Source |
|---|---|---|---|
| Cu-S-HHS interfacial filmresearch_0244__mat__mat_cu_s_hhs | Thin Film · Target Sample · Pristine Framework | liquid/liquid interfacial growth; transferred to quartzquartz glass substrate | S46/S57 · Sample / measurement preparation · Figures S46 / S61 |
| Cu-S-HHS DFT modelresearch_0244__mat__mat_cu_s_hhs | Model · Model System · Model | MicroED/PXRD-derived geometry relaxed in CASTEP | S65-S68 · Sample / measurement preparation · Figures S76-S81 |
| Cu-S-HHS pressed pelletresearch_0244__mat__mat_cu_s_hhs | Pellet · Target Sample · Pristine Framework | pressed MOF powder pellet for four-probe and Hall transport | S49/S55 · Sample / measurement preparation · Figures S50-S52 / S60 |
| Cu-S-HHS plate deviceresearch_0244__mat__mat_cu_s_hhs | Single Crystal · Target Sample · Pristine Framework | magnet-clamped substrate method then EBL Ti/Au contactsSi/SiO2 with Ti/Au electrodes | S51-S52 · Sample / measurement preparation · Figures S54-S55 |
| Cu-S-HHS solvothermal powderresearch_0244__mat__mat_cu_s_hhs | Powder · Target Sample · Pristine Framework | solvothermal powder; purplish/dark purple; washed with water and acetone; vacuum dried | S13 · Sample / measurement preparation · Scheme S2 |
| Cu-S-HHS rod deviceresearch_0244__mat__mat_cu_s_hhs | Single Crystal · Target Sample · Pristine Framework | drop-cast rod sample; PMMA/EBL; Ti/Au contactsSi/SiO2 with Ti/Au electrodes | S51-S53 · Sample / measurement preparation · Figures S55-S56 |
| Cu-Se-HHS interfacial filmresearch_0244__mat__mat_cu_se_hhs | Thin Film · Target Sample · Pristine Framework | liquid/liquid interfacial growth; transferred to quartzquartz glass substrate | S46/S57 · Sample / measurement preparation · Figures S46 / S61 |
| Cu-Se-HHS DFT modelresearch_0244__mat__mat_cu_se_hhs | Model · Model System · Model | MicroED/PXRD-derived geometry relaxed in CASTEP | S65-S68 · Sample / measurement preparation · Figures S76-S81 |
| Cu-Se-HHS pressed pelletresearch_0244__mat__mat_cu_se_hhs | Pellet · Target Sample · Pristine Framework | pressed MOF powder pellet for four-probe and Hall transport | S49/S55 · Sample / measurement preparation · Figures S50-S52 / S60 |
| Cu-Se-HHS solvothermal powderresearch_0244__mat__mat_cu_se_hhs | Powder · Target Sample · Pristine Framework | solvothermal powder; dark grey; washed with water and acetone; vacuum dried | S14 · Sample / measurement preparation · Scheme S3 |
| Cu-Se-HHS rod deviceresearch_0244__mat__mat_cu_se_hhs | Single Crystal · Target Sample · Pristine Framework | drop-cast rod sample; PMMA/EBL; Ti/Au contactsSi/SiO2 with Ti/Au electrodes | S51-S53 · Sample / measurement preparation · Figures S55-S56 |
| Cu-Te-HHS interfacial filmresearch_0244__mat__mat_cu_te_hhs | Thin Film · Target Sample · Pristine Framework | liquid/liquid interfacial growth; transferred to quartzquartz glass substrate | S46/S57 · Sample / measurement preparation · Figures S46 / S61 |
| Cu-Te-HHS DFT modelresearch_0244__mat__mat_cu_te_hhs | Model · Model System · Model | MicroED/PXRD-derived geometry relaxed in CASTEP | S65-S68 · Sample / measurement preparation · Figures S76-S81 |
| Cu-Te-HHS pressed pelletresearch_0244__mat__mat_cu_te_hhs | Pellet · Target Sample · Pristine Framework | pressed MOF powder pellet for four-probe and Hall transport | S49/S55 · Sample / measurement preparation · Figures S50-S52 / S60 |
| Cu-Te-HHS solvothermal powderresearch_0244__mat__mat_cu_te_hhs | Powder · Target Sample · Pristine Framework | solvothermal powder; dark blue to black; washed with water and acetone; vacuum dried | S15 · Sample / measurement preparation · Scheme S4 |
| Cu-Te-HHS rod deviceresearch_0244__mat__mat_cu_te_hhs | Single Crystal · Target Sample · Pristine Framework | drop-cast rod sample; PMMA/EBL; Ti/Au contactsSi/SiO2 with Ti/Au electrodes | S51-S53 · Sample / measurement preparation · Figures S55-S56 |