Spectroscopy — Enhanced Electrical Conductivity by the Heavy Chalcogen Effect in Metal-Organic Frameworks

9 measurement groups · 22 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

FTIR, Raman, XPS, EPR spectroscopy

Infrared spectroscopy Raman spectroscopy X-ray photoelectron spectroscopy Electron paramagnetic resonance

Cu-S-HHS solvothermal powder · Powder

KBr FTIR; SERS with silver nanoparticles/APTS glass; XPS Al Kalpha; EPR X-band at 120 K.

Temperature: 120 K for EPR
Context: pristine framework sample
Measurement source: S16/S30/S36/S42 · 3, 8, 12, 14. Spectroscopy · Figures S12/S33/S36-S41

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Cu-S-HHS EPR g-factor	2.11	—	—	Text Rounded Reported	S44 · 15. Analysis of Magnetic Properties · Figure S41 / text
Cu-S-HHS C-X Raman vibration	895 cm-1	—	—	Text Exact Reported	24155 · Structural Characterizations · Figure S33
Cu-S-HHS XPS elemental presence	C, O, Cu and chalcogenide present; trace N observed	—	—	Text Qualitative	S36 · 12. X-ray Photoelectron Spectroscopy · Figure S36
Cu-S-HHS copper mixed valence	Cu2+ and Cu+ both present	—	—	Text Qualitative	S36 · 12. X-ray Photoelectron Spectroscopy · Figure S39

ultraviolet photoelectron spectroscopy

Ultraviolet photoelectron spectroscopy

Cu-S-HHS solvothermal powder · Powder

Powder pressed on foam copper; He lamp hnu=21.22 eV; Au Fermi-edge correction; IE from cutoff and VBM.

Context: pristine framework sample
Measurement source: S54 · 19. Ultraviolet Photoelectron Spectroscopy · Figures S57-S58

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Cu-S-HHS UPS ionisation potential	6.728 eV	—	—	Text Exact Reported	S54 · 19. Ultraviolet Photoelectron Spectroscopy · Figure S57

UV-vis-NIR transmission spectroscopy and Tauc analysis

UV-visible and optical absorption spectroscopy

Cu-S-HHS interfacial film · Thin Film

Interfacial MOF film transferred to quartz; transmission mode with integrating sphere and 20 nm slit.

Context: pristine framework sample
Measurement source: S46-S48 · 16. UV-Visible-Near Infrared Spectrum · Figures S46-S49

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Cu-S-HHS direct optical bandgap	0.93 eV	—	—	Text Exact Reported	S48 · 16.2. UV-Vis-NIR Spectra and Calculation of Optical Bandgap · Figure S48
Cu-S-HHS film thickness	900 nm	—	—	Text Exact Reported	S57 · 21.1. Preparation and Characterization of Samples · Figure S61
Cu-S-HHS indirect optical bandgap	0.85 eV	—	—	Text Exact Reported	S48 · 16.2. UV-Vis-NIR Spectra and Calculation of Optical Bandgap · Figure S49

FTIR, Raman, XPS, EPR spectroscopy

Infrared spectroscopy Raman spectroscopy X-ray photoelectron spectroscopy Electron paramagnetic resonance

Cu-Se-HHS solvothermal powder · Powder

KBr FTIR; SERS with silver nanoparticles/APTS glass; XPS Al Kalpha; EPR X-band at 120 K.

Temperature: 120 K for EPR
Context: pristine framework sample
Measurement source: S16/S30/S36/S42 · 3, 8, 12, 14. Spectroscopy · Figures S13/S33/S36-S41

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Cu-Se-HHS EPR g-factor	2.11	—	—	Text Rounded Reported	S44 · 15. Analysis of Magnetic Properties · Figure S41 / text
Cu-Se-HHS C-X Raman vibration	842 cm-1	—	—	Text Exact Reported	24155 · Structural Characterizations · Figure S33
Cu-Se-HHS XPS elemental presence	C, O, Cu and chalcogenide present; trace N observed	—	—	Text Qualitative	S36 · 12. X-ray Photoelectron Spectroscopy · Figure S36
Cu-Se-HHS copper mixed valence	Cu2+ and Cu+ both present	—	—	Text Qualitative	S36 · 12. X-ray Photoelectron Spectroscopy · Figure S39

ultraviolet photoelectron spectroscopy

Ultraviolet photoelectron spectroscopy

Cu-Se-HHS solvothermal powder · Powder

Powder pressed on foam copper; He lamp hnu=21.22 eV; Au Fermi-edge correction; IE from cutoff and VBM.

Context: pristine framework sample
Measurement source: S54 · 19. Ultraviolet Photoelectron Spectroscopy · Figures S57-S58

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Cu-Se-HHS UPS ionisation potential	6.714 eV	—	—	Text Exact Reported	S54 · 19. Ultraviolet Photoelectron Spectroscopy · Figure S57

UV-vis-NIR transmission spectroscopy and Tauc analysis

UV-visible and optical absorption spectroscopy

Cu-Se-HHS interfacial film · Thin Film

Interfacial MOF film transferred to quartz; transmission mode with integrating sphere and 20 nm slit.

Context: pristine framework sample
Measurement source: S46-S48 · 16. UV-Visible-Near Infrared Spectrum · Figures S46-S49

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Cu-Se-HHS direct optical bandgap	0.72 eV	—	—	Text Exact Reported	S48 · 16.2. UV-Vis-NIR Spectra and Calculation of Optical Bandgap · Figure S48
Cu-Se-HHS film thickness	400 nm	—	—	Text Exact Reported	S57 · 21.1. Preparation and Characterization of Samples · Figure S61

FTIR, Raman, XPS, EPR spectroscopy

Infrared spectroscopy Raman spectroscopy X-ray photoelectron spectroscopy Electron paramagnetic resonance

Cu-Te-HHS solvothermal powder · Powder

KBr FTIR; SERS with silver nanoparticles/APTS glass; XPS Al Kalpha; EPR X-band at 120 K.

Temperature: 120 K for EPR
Context: pristine framework sample
Measurement source: S17/S30/S36/S42 · 3, 8, 12, 14. Spectroscopy · Figures S14/S33/S36-S41

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Cu-Te-HHS EPR g-factor	2.08	—	—	Text Rounded Reported	S44 · 15. Analysis of Magnetic Properties · Figure S41 / text
Cu-Te-HHS C-X Raman vibration	637 cm-1	—	—	Text Exact Reported	24155 · Structural Characterizations · Figure S33
Cu-Te-HHS XPS elemental presence	C, O, Cu and chalcogenide present; trace N observed	—	—	Text Qualitative	S36 · 12. X-ray Photoelectron Spectroscopy · Figure S36
Cu-Te-HHS copper mixed valence	Cu2+ and Cu+ both present	—	—	Text Qualitative	S36 · 12. X-ray Photoelectron Spectroscopy · Figure S39

ultraviolet photoelectron spectroscopy

Ultraviolet photoelectron spectroscopy

Cu-Te-HHS solvothermal powder · Powder

Powder pressed on foam copper; He lamp hnu=21.22 eV; Au Fermi-edge correction; IE from cutoff and VBM.

Context: pristine framework sample
Measurement source: S54 · 19. Ultraviolet Photoelectron Spectroscopy · Figures S57-S58

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Cu-Te-HHS UPS ionisation potential	6.515 eV	—	—	Text Exact Reported	S54 · 19. Ultraviolet Photoelectron Spectroscopy · Figure S57

UV-vis-NIR transmission spectroscopy and Tauc analysis

UV-visible and optical absorption spectroscopy

Cu-Te-HHS interfacial film · Thin Film

Interfacial MOF film transferred to quartz; transmission mode with integrating sphere and 20 nm slit.

Context: pristine framework sample
Measurement source: S46-S48 · 16. UV-Visible-Near Infrared Spectrum · Figures S46-S49

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Cu-Te-HHS direct optical bandgap	0.85 eV	—	—	Text Exact Reported	S48 · 16.2. UV-Vis-NIR Spectra and Calculation of Optical Bandgap · Figure S48
Cu-Te-HHS film thickness	500 nm	—	—	Text Exact Reported	S57 · 21.1. Preparation and Characterization of Samples · Figure S61