Microscopy Morphology — Enhanced Electrical Conductivity by the Heavy Chalcogen Effect in Metal-Organic Frameworks

3 measurement groups · 12 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

Cu-S-HHS solvothermal powder · Powder

Powders pressed on carbon tape for SEM; TEM powder dispersed in methanol on ultrathin carbon film.

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Cu-S-HHS EDX chalcogen distribution	uniform distribution of the incorporated chalcogen	—	—	Text Qualitative	24154 · Structural Characterizations · Figures S24-S26
Cu-S-HHS in-plane honeycomb lattice distance	1.8 nm	—	—	Text Rounded Reported	24154-24155 · Structural Characterizations · Figure 3 / Figures S30-S32
Cu-S-HHS interlayer spacing	about 0.34 nm	—	—	Text Approximate	24155 · Structural Characterizations · Figure 3 / Figures S30-S32
Cu-S-HHS morphology	rod-shaped morphology	—	—	Text Qualitative	24154 · Structural Characterizations · Figure 3 / Figures S21-S23

Cu-Se-HHS solvothermal powder · Powder

Powders pressed on carbon tape for SEM; TEM powder dispersed in methanol on ultrathin carbon film.

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Cu-Se-HHS EDX chalcogen distribution	uniform distribution of the incorporated chalcogen	—	—	Text Qualitative	24154 · Structural Characterizations · Figures S24-S26
Cu-Se-HHS in-plane honeycomb lattice distance	1.8 nm	—	—	Text Rounded Reported	24154-24155 · Structural Characterizations · Figure 3 / Figures S30-S32
Cu-Se-HHS interlayer spacing	about 0.34 nm	—	—	Text Approximate	24155 · Structural Characterizations · Figure 3 / Figures S30-S32
Cu-Se-HHS morphology	rod-shaped morphology	—	—	Text Qualitative	24154 · Structural Characterizations · Figure 3 / Figures S21-S23

Cu-Te-HHS solvothermal powder · Powder

Powders pressed on carbon tape for SEM; TEM powder dispersed in methanol on ultrathin carbon film.

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Cu-Te-HHS EDX chalcogen distribution	uniform distribution of the incorporated chalcogen	—	—	Text Qualitative	24154 · Structural Characterizations · Figures S24-S26
Cu-Te-HHS in-plane honeycomb lattice distance	1.8 nm	—	—	Text Rounded Reported	24154-24155 · Structural Characterizations · Figure 3 / Figures S30-S32
Cu-Te-HHS interlayer spacing	about 0.34 nm	—	—	Text Approximate	24155 · Structural Characterizations · Figure 3 / Figures S30-S32
Cu-Te-HHS morphology	rod-shaped morphology	—	—	Text Qualitative	24154 · Structural Characterizations · Figure 3 / Figures S21-S23