Synthesis evidence

Ligand-Oxidation-Based Anodic Synthesis of Oriented Films of Conductive M-Catecholate Metal-Organic Frameworks with Controllable Thickness

Song M., Jia J., Li P. et al. · Journal of the American Chemical Society · 2023 · 25570-25578

8 structured synthesis routes

Completeness describes how fully the route could be reconstructed from the main article and supporting information.

Complete recipeSource: SI

Route 1: Electrochemical

SI p.3 · Anodic deposition of M-catecholate MOF films · Fig. S31

Metal precursorsCo(Ac)2 (2.25 mM); SI chemicals list specifies Co(Ac)2.4H2O.
Linker precursorsHHTP (1.125 mM)
Solventsn-propanol/H2O (v/v 1:1.5)
AdditivesHAc (2.4 mM); NaCl (100 mM)
AtmospherePrecursor freshly prepared and purged with nitrogen for 30 min.
Temperature30
Time1 for Fig. S31 sample (60 min)
Substrate orientationAu working electrode; FTO counter; Ag/AgCl reference.
Oxidant / reductantAnodic ligand oxidation at 0.30 V.
Work-upRinsed with DMF and methanol; dried under nitrogen flow.
ActivationNot reported.
Scalability contextGenerality demonstration only.
Show 5 structured reagent records
RoleReagentAmount / concentrationSource
Metal SourceCo(Ac)22.25 mMSI p.3 · Anodic deposition of M-catecholate MOF films · Fig. S31
LinkerHHTP1.125 mMSI p.3 · Anodic deposition of M-catecholate MOF films · Fig. S31
AcidHAc2.4 mMSI p.3 · Anodic deposition of M-catecholate MOF films · Fig. S31
ElectrolyteNaCl100 mMSI p.3 · Anodic deposition of M-catecholate MOF films · Fig. S31
Solventn-propanol/H2Ov/v 1:1.5SI p.3 · Anodic deposition of M-catecholate MOF films · Fig. S31
Complete recipeSource: Both

Route 2: Electrochemical

SI p.3 · Anodic deposition of M-catecholate MOF films

Metal precursorsCu(NO3)2 (2.25 mM); SI chemicals list specifies Cu(NO3)2.3H2O.
Linker precursorsHHTP (1.125 mM)
SolventsDMF/H2O (v/v 1:15)
AdditivesHNO3 (0.5 mM); NaCl (100 mM) supporting electrolyte
AtmosphereNitrogen-saturated precursor solution; deposition under nitrogen atmosphere after 30 min N2 purge.
Temperature30
TimeDesired time; main Figure 2 sample used 45 min (0.75 h).
Substrate orientationAu, silicon, ITO, FTO or freshly peeled HOPG working electrode; FTO counter; Ag/AgCl reference.
Oxidant / reductantAnodic oxidation of redox-active HHTP catechol ligand at 0.25-0.35 V versus Ag/AgCl.
Work-upRinsed with DMF and methanol; dried under nitrogen flow.
ActivationFor gas sorption only: evacuated under vacuum at 100 C for 24 h.
Scalability contextMain text states the approximately 2.5 x 2.5 cm2 film area can be increased using a larger electrode.
Show 5 structured reagent records
RoleReagentAmount / concentrationSource
Metal SourceCu(NO3)2; Cu(NO3)2.3H2O listed in chemicals2.25 mMSI p.3 · Anodic deposition of M-catecholate MOF films
LinkerHHTP1.125 mMSI p.3 · Anodic deposition of M-catecholate MOF films
AcidHNO30.5 mMSI p.3 · Anodic deposition of M-catecholate MOF films
ElectrolyteNaCl100 mMSI p.3 · Anodic deposition of M-catecholate MOF films
SolventDMF/H2Ov/v 1:15SI p.3 · Anodic deposition of M-catecholate MOF films
Complete recipeSource: Both

Route 3: Electrochemical

SI p.4 · Device fabrication and conductivity measurement · Fig. S25

Metal precursorsCu(NO3)2-based Cu3(HHTP)2 anodic precursor solution as above.
Linker precursorsHHTP
SolventsDMF/H2O precursor solvent; I2/KI aqueous etchant used after deposition.
AdditivesHNO3, NaCl in precursor; I2/KI etching solution; Au evaporated contacts.
AtmosphereNitrogen-purged precursor for deposition; electrical measurement under ~10^-5 mbar vacuum.
Temperature30 for deposition; transport measured 100-300 K
TimeNot specified for achieving ~100 nm film.
Substrate orientationAu (40 nm) pre-coated silica glass slide without Cr adhesive layer; final film stacked on silica after Au removal.
Oxidant / reductantAnodic ligand oxidation during film deposition; iodine/iodide chemical etching of underlying Au.
Work-upUnderlying Au etched in I2/KI aqueous solution; four 40 nm Au contacts evaporation-deposited through a shadow mask.
ActivationNo gas-sorption activation; transport measured under vacuum.
Scalability contextFour-probe geometry: L 100 um, W 9000 um, d 100 nm.
Show 3 structured reagent records
RoleReagentAmount / concentrationSource
OtherAu pre-coated silica glass slide40 nm AuSI p.4 · Device fabrication and conductivity measurement · Fig. S25
OxidantI2/KI aqueous solutionNot specifiedSI p.4 · Device fabrication and conductivity measurement · Fig. S25
OtherAu contact electrodes40 nm thicknessSI p.4 · Device fabrication and conductivity measurement · Fig. S25
Partial recipeSource: Both

Route 4: Electrochemical

main p.6, article p.25575 · Results and Discussion · Fig. 6

Metal precursorsCu(NO3)2-based Cu3(HHTP)2 anodic precursor solution as above.
Linker precursorsHHTP
SolventsDMF/H2O precursor solution; solvent for PCTE removal not specified in text.
AdditivesHNO3 and NaCl in precursor.
AtmosphereNitrogen-purged precursor / nitrogen atmosphere as for anodic deposition.
Temperature30
TimeNot specified for nanorod growth.
Substrate orientationAu-coated PCTE membrane template; pore diameter 200 nm, membrane thickness 10 um.
Oxidant / reductantAnodic ligand oxidation confined in porous PCTE template.
Work-upPCTE template removed by dissolution to release nanorods.
ActivationNot reported.
Scalability contextTemplate converts continuous film growth to high-aspect-ratio nanorods.
Show 3 structured reagent records
RoleReagentAmount / concentrationSource
OtherAu-coated PCTE membrane200 nm pore diameter; 10 um thicknessmain p.6, article p.25575 · Results and Discussion · Fig. 6
Metal SourceCu(NO3)22.25 mMmain p.6, article p.25575 · Results and Discussion · Fig. 6
LinkerHHTP1.125 mMmain p.6, article p.25575 · Results and Discussion · Fig. 6
Complete recipeSource: SI

Route 5: Solvothermal

SI p.3 · Solvothermal synthesis of Cu3(HHTP)2 film · Fig. S7

Metal precursorsCopper acetate monohydrate (80 mg, 0.4 mmol)
Linker precursorsHHTP (65 mg, 0.2 mmol)
Solvents10 mL water/DMF (v/v 1:1)
AdditivesNone reported.
AtmosphereNot specified.
Temperature85
Time18
Substrate orientationAu-coated glass substrate placed face-down in solution.
Oxidant / reductantNot specified; solvothermal coordination growth.
Work-upAfter cooling, rinsed with DMF and methanol; dried under nitrogen flow.
ActivationNot reported.
Scalability contextLiterature control route; no scale-up claim in this work.
Show 3 structured reagent records
RoleReagentAmount / concentrationSource
Metal Sourcecopper acetate monohydrate80 mg, 0.4 mmolSI p.3 · Solvothermal synthesis of Cu3(HHTP)2 film · Fig. S7
LinkerHHTP65 mg, 0.2 mmolSI p.3 · Solvothermal synthesis of Cu3(HHTP)2 film · Fig. S7
Solventwater/DMF10 mL · v/v 1:1SI p.3 · Solvothermal synthesis of Cu3(HHTP)2 film · Fig. S7
Complete recipeSource: SI

Route 6: Electrochemical

SI p.3 · Anodic deposition of M-catecholate MOF films · Fig. S37

Metal precursorsCu(NO3)2 (2.25 mM)
Linker precursors8OH-TBA (1.125 mM)
SolventsDMF/H2O (v/v 1:1.5)
AdditivesHNO3 (0.75 mM); NaCl (100 mM)
AtmospherePrecursor freshly prepared and purged with nitrogen for 30 min.
Temperature30
Time1 for Fig. S37 sample (60 min)
Substrate orientationAu working electrode; FTO counter; Ag/AgCl reference.
Oxidant / reductantAnodic oxidation of TBA catechol ligand at 0.30 V.
Work-upRinsed with DMF and methanol; dried under nitrogen flow.
ActivationNot reported.
Scalability contextGenerality demonstration with an alternate catechol linker.
Show 5 structured reagent records
RoleReagentAmount / concentrationSource
Metal SourceCu(NO3)22.25 mMSI p.3 · Anodic deposition of M-catecholate MOF films · Fig. S37
Linker8OH-TBA1.125 mMSI p.3 · Anodic deposition of M-catecholate MOF films · Fig. S37
AcidHNO30.75 mMSI p.3 · Anodic deposition of M-catecholate MOF films · Fig. S37
ElectrolyteNaCl100 mMSI p.3 · Anodic deposition of M-catecholate MOF films · Fig. S37
SolventDMF/H2Ov/v 1:1.5SI p.3 · Anodic deposition of M-catecholate MOF films · Fig. S37
Complete recipeSource: SI

Route 7: Electrochemical

SI p.3 · Anodic deposition of M-catecholate MOF films · Fig. S34

Metal precursorsYb(NO3)3 (90 mM); SI chemicals list specifies Yb(NO3)3.5H2O.
Linker precursorsHHTP (2.16 mM)
SolventsDMI/H2O (v/v 1:20)
AdditivesHNO3 (0.4 mM)
AtmospherePrecursor freshly prepared and purged with nitrogen for 30 min.
Temperature30
Time1 for Fig. S34 sample (60 min)
Substrate orientationAu working electrode; FTO counter; Ag/AgCl reference.
Oxidant / reductantAnodic ligand oxidation at 0.25 V.
Work-upRinsed with DMF and methanol; dried under nitrogen flow.
ActivationNot reported.
Scalability contextGenerality demonstration only.
Show 4 structured reagent records
RoleReagentAmount / concentrationSource
Metal SourceYb(NO3)390 mMSI p.3 · Anodic deposition of M-catecholate MOF films · Fig. S34
LinkerHHTP2.16 mMSI p.3 · Anodic deposition of M-catecholate MOF films · Fig. S34
AcidHNO30.4 mMSI p.3 · Anodic deposition of M-catecholate MOF films · Fig. S34
SolventDMI/H2Ov/v 1:20SI p.3 · Anodic deposition of M-catecholate MOF films · Fig. S34
Complete recipeSource: SI

Route 8: Electrochemical

SI p.3 · Anodic deposition of M-catecholate MOF films · Fig. S28

Metal precursorsZn(Ac)2 (2.25 mM); SI chemicals list specifies Zn(Ac)2.2H2O.
Linker precursorsHHTP (1.125 mM)
Solventsn-propanol/H2O (v/v 1:1.5)
AdditivesHAc (2.4 mM); NaCl (100 mM)
AtmospherePrecursor freshly prepared and purged with nitrogen for 30 min.
Temperature30
Time0.5 for Fig. S28 sample (30 min)
Substrate orientationAu working electrode; FTO counter; Ag/AgCl reference.
Oxidant / reductantAnodic ligand oxidation at 0.30 V.
Work-upRinsed with DMF and methanol; dried under nitrogen flow.
ActivationNot reported.
Scalability contextGenerality demonstration only.
Show 5 structured reagent records
RoleReagentAmount / concentrationSource
Metal SourceZn(Ac)22.25 mMSI p.3 · Anodic deposition of M-catecholate MOF films · Fig. S28
LinkerHHTP1.125 mMSI p.3 · Anodic deposition of M-catecholate MOF films · Fig. S28
AcidHAc2.4 mMSI p.3 · Anodic deposition of M-catecholate MOF films · Fig. S28
ElectrolyteNaCl100 mMSI p.3 · Anodic deposition of M-catecholate MOF films · Fig. S28
Solventn-propanol/H2Ov/v 1:1.5SI p.3 · Anodic deposition of M-catecholate MOF films · Fig. S28