Diffraction Structure — Ligand-Oxidation-Based Anodic Synthesis of Oriented Films of Conductive M-Catecholate Metal-Organic Frameworks with Controllable Thickness

11 measurement groups · 23 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

SEM, EDX, XRD; FT-IR in Fig. S32

Infrared spectroscopy X-ray diffraction and scattering Scanning electron microscopy Elemental microanalysis and mapping

Co3(HHTP)2 film on Au electrode · Thin Film

Co3(HHTP)2 film deposited on Au electrode at 0.3 V for 60 min.

Atmosphere: Nitrogen-purged precursor
Context: Pristine Co3(HHTP)2 generality film.
Measurement source: SI p.34 · Supplementary data · Fig. S31

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Co3(HHTP)2 SI figure deposition condition	0.3 V for 60 min	—	—	Caption Rounded Reported	SI p.34 · Supplementary data · Fig. S31
Co3(HHTP)2 oriented-film assignment	out-of-plane oriented film successfully synthesised	—	—	Text Qualitative	main p.6, article p.25575 · Results and Discussion · Figures S27-S38

SEM and XRD

X-ray diffraction and scattering Scanning electron microscopy

Cu3(HHTP)2 film on FTO electrode · Thin Film

Cu3(HHTP)2 film deposited on FTO electrode at 0.25 V.

Context: Substrate-generalisation pristine Cu3(HHTP)2 film.
Measurement source: SI p.13 · Supplementary data · Fig. S9

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Cu3(HHTP)2 film formed on FTO	top-view SEM and XRD confirm film deposition and oriented Cu3(HHTP)2 reflections	—	—	Caption Qualitative	SI p.13 · Supplementary data · Fig. S9

SEM and XRD

X-ray diffraction and scattering Scanning electron microscopy

Cu3(HHTP)2 film on HOPG electrode · Thin Film

Cu3(HHTP)2 film deposited on HOPG electrode at 0.25 V.

Context: Substrate-generalisation pristine Cu3(HHTP)2 film.
Measurement source: SI p.15 · Supplementary data · Fig. S11

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Cu3(HHTP)2 film formed on HOPG	top-view SEM and XRD confirm film deposition and oriented Cu3(HHTP)2 reflections	—	—	Caption Qualitative	SI p.15 · Supplementary data · Fig. S11

SEM and XRD

X-ray diffraction and scattering Scanning electron microscopy

Cu3(HHTP)2 film on ITO electrode · Thin Film

Cu3(HHTP)2 film deposited on ITO electrode at 0.25 V.

Context: Substrate-generalisation pristine Cu3(HHTP)2 film.
Measurement source: SI p.12 · Supplementary data · Fig. S8

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Cu3(HHTP)2 film formed on ITO	top-view SEM and XRD confirm film deposition and oriented Cu3(HHTP)2 reflections	—	—	Caption Qualitative	SI p.12 · Supplementary data · Fig. S8

SEM and XRD

X-ray diffraction and scattering Scanning electron microscopy

Cu3(HHTP)2 film on silicon electrode · Thin Film

Cu3(HHTP)2 film deposited on silicon electrode at 0.25 V.

Context: Substrate-generalisation pristine Cu3(HHTP)2 film.
Measurement source: SI p.14 · Supplementary data · Fig. S10

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Cu3(HHTP)2 film formed on silicon	top-view SEM and XRD confirm film deposition and oriented Cu3(HHTP)2 reflections	—	—	Caption Qualitative	SI p.14 · Supplementary data · Fig. S10

SEM and XRD

X-ray diffraction and scattering Scanning electron microscopy

Solvothermally grown Cu3(HHTP)2 film on Au electrode · Thin Film

Solvothermally grown Cu3(HHTP)2 film on Au electrode.

Context: Pristine-control film prepared by a non-anodic route.
Measurement source: SI p.11 · Supplementary data · Fig. S7

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
solvothermal control characterisation	top-view SEM, cross-sectional SEM and XRD patterns reported	—	—	Caption Qualitative	SI p.11 · Supplementary data · Fig. S7

SEM and XRD; FT-IR in Fig. S38

Infrared spectroscopy X-ray diffraction and scattering Scanning electron microscopy

Cu2TBA film on Au electrode · Thin Film

Cu2TBA film deposited on Au electrode at 0.3 V for 60 min.

Atmosphere: Nitrogen-purged precursor
Context: Pristine Cu2TBA generality film.
Measurement source: SI p.40 · Supplementary data · Fig. S37

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Cu2TBA SI figure deposition condition	0.3 V for 60 min	—	—	Caption Rounded Reported	SI p.40 · Supplementary data · Fig. S37
Cu2TBA oriented-film assignment	out-of-plane oriented film successfully synthesised	—	—	Text Qualitative	main p.6, article p.25575 · Results and Discussion · Figures S27-S38

TEM and electron diffraction

Electron diffraction Transmission electron microscopy

Cu3(HHTP)2 film on Au/Cr/glass anode deposited at 0.25 V for 45 min · Thin Film

Fragment removed from Au electrode and settled on TEM grid with (002) plane parallel to electron beam.

Context: Pristine film structure assignment.
Measurement source: main p.3, article p.25572 · Results and Discussion · Fig. 2d,e

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
ED growth-direction feature	symmetric streaks of (002) plane along the growth direction	—	—	Text Qualitative	main p.3, article p.25572 · Results and Discussion · Fig. 2e
interlayer distance from ED	3.12 A	—	—	Text Rounded Reported	main p.3, article p.25572 · Results and Discussion · Fig. 2e

In-plane and out-of-plane XRD; rocking curve; pole figure

X-ray diffraction and scattering

Cu3(HHTP)2 film on Au/Cr/glass anode deposited at 0.25 V for 45 min · Thin Film

Cu3(HHTP)2 film on Au electrode after 0.25 V, 45 min deposition.

Context: Pristine film structure assignment.
Measurement source: main p.2-3, article pp.25571-25572 · Results and Discussion · Fig. 2c; Fig. S3

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
interlayer distance from XRD	3.20 A	—	—	Text Rounded Reported	main p.2, article p.25571 · Results and Discussion · Fig. 2c
out-of-plane orientation assignmentMarked as a best value within this paper	[001] oriented; not oriented in-plane	—	—	Text Qualitative	main p.3, article p.25572 · Results and Discussion · Fig. S3c
(002) rocking-curve FWHM	0.23 deg	—	—	Text Rounded Reported	main p.2, article p.25571 · Results and Discussion · Fig. S3b
out-of-plane XRD (002) peak	27.9 deg	—	—	Text Rounded Reported	main p.2, article p.25571 · Results and Discussion · Fig. 2c
in-plane XRD (100) peak	4.7 deg 2theta	—	—	Text Rounded Reported	main p.2, article p.25571 · Results and Discussion · Fig. 2c
in-plane XRD (200) peak	9.5 deg 2theta	—	—	Text Rounded Reported	main p.2, article p.25571 · Results and Discussion · Fig. 2c
in-plane XRD (210) peak	12.6 deg 2theta	—	—	Text Rounded Reported	main p.2, article p.25571 · Results and Discussion · Fig. 2c
in-plane XRD (220) peak	16.4 deg 2theta	—	—	Text Rounded Reported	main p.2, article p.25571 · Results and Discussion · Fig. 2c

SEM and XRD; FT-IR in Fig. S35

Infrared spectroscopy X-ray diffraction and scattering Scanning electron microscopy

YbHHTP film on Au electrode · Thin Film

YbHHTP film deposited on Au electrode at 0.25 V for 60 min.

Atmosphere: Nitrogen-purged precursor
Context: Pristine YbHHTP generality film.
Measurement source: SI p.37 · Supplementary data · Fig. S34

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
YbHHTP SI figure deposition condition	0.25 V for 60 min	—	—	Caption Rounded Reported	SI p.37 · Supplementary data · Fig. S34
YbHHTP oriented-film assignment	out-of-plane oriented film successfully synthesised	—	—	Text Qualitative	main p.6, article p.25575 · Results and Discussion · Figures S27-S38

SEM, EDX, XRD; FT-IR in Fig. S29

Infrared spectroscopy X-ray diffraction and scattering Scanning electron microscopy Elemental microanalysis and mapping

Zn3(HHTP)2 film on Au electrode · Thin Film

Zn3(HHTP)2 film deposited on Au electrode at 0.3 V for 30 min.

Atmosphere: Nitrogen-purged precursor
Context: Pristine Zn3(HHTP)2 generality film.
Measurement source: SI p.31 · Supplementary data · Fig. S28

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Zn3(HHTP)2 SI figure deposition condition	0.3 V for 30 min	—	—	Caption Rounded Reported	SI p.31 · Supplementary data · Fig. S28
Zn3(HHTP)2 oriented-film assignment	out-of-plane oriented film successfully synthesised	—	—	Text Qualitative	main p.6, article p.25575 · Results and Discussion · Figures S27-S38